1,722
edits
Patent US 8436624B2: Difference between revisions
no edit summary
No edit summary |
No edit summary |
||
| Line 4: | Line 4: | ||
|Title=Signal acquisition system having reduced probe loading of a device under test | |Title=Signal acquisition system having reduced probe loading of a device under test | ||
|Company=Tektronix Inc | |Company=Tektronix Inc | ||
|Inventors=Josiah A. BARTLETT; Ira G. Pollock; Dan Knierim; | |Inventors=Josiah A. BARTLETT; Ira G. Pollock; Dan Knierim; Les Larson; Scott R. Jansen; Kenneth P. Dobyns; Michael Duane Stevens | ||
|Filing date=2010-07-29 | |Filing date=2010-07-29 | ||
|Grant date=2013-05-07 | |Grant date=2013-05-07 | ||
}} | }} | ||