DM502: Difference between revisions

135 bytes added ,  31 January 2019
m
adding information to rear interface differences
(→‎DM502A: adding rear interface picture)
m (adding information to rear interface differences)
Line 8: Line 8:
The DM502 is available with an input for temperature measurement with a transistor temperatur probe ([[P6430]]) using a NPN-Transistor, e.g. 2N2484 (any NPN-Transistor with  hFE>150 can be used.
The DM502 is available with an input for temperature measurement with a transistor temperatur probe ([[P6430]]) using a NPN-Transistor, e.g. 2N2484 (any NPN-Transistor with  hFE>150 can be used.


The DM502A model adds an input for a PT-100 temperature probe ([[P6601]]), a true RMS converter, and offset circuits to read dB directly in all ranges. An "Option 2" instrument deletes the temperature measurement function, P6601 temperature probe, and all internal circuits associated with this function
The DM502'''A''' model adds an input for a PT-100 temperature probe ([[P6601]]), a true RMS converter, and offset circuits to read dB directly in all ranges. An "Option 2" instrument deletes the temperature measurement function, P6601 temperature probe, and all internal circuits associated with this function. The rear interface of DM502'''A''' is limited compared to the DM502: No current input and no reading output, see gallery below.


The 2-kΩ-measurement range (+HI in DM502A) can be used for diode testing, since a current source of 1mA is active  
The 2-kΩ-measurement range (+HI in DM502A) can be used for diode testing, since a current source of 1mA is active  
132

edits