Application Notes: Difference between revisions

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(Added link to AX-3607)
(Added links to AX-3106 and 26W-4889)
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* [[Media:AX-3079.pdf|AX-3079: Television Products App Note no. 17, ''The Auxiliary Video Facility of the 1480-Series of Waveform Monitors'']], 1974 (PDF)  ''(→ [[1480]])''
* [[Media:AX-3079.pdf|AX-3079: Television Products App Note no. 17, ''The Auxiliary Video Facility of the 1480-Series of Waveform Monitors'']], 1974 (PDF)  ''(→ [[1480]])''
* [[Media:AX-3106.pdf|AX-3106: Television Application Note no. 19, ''Vertical Interval Test Signals - Reprogramming Tektronix Signal Generators'']], 1975 (PDF)  ''(→ [[147]] [[149]] [[1440]])''
* [[Media:AX-3535.pdf|AX-3535: M. Engelson, ''Crystal Device Measurements Using the Spectrum Analyzer'']], 1977 (PDF)
* [[Media:AX-3535.pdf|AX-3535: M. Engelson, ''Crystal Device Measurements Using the Spectrum Analyzer'']], 1977 (PDF)
* [[Media:Ax-3607.pdf|AX-3607: S. C. Baunach, ''An Example of an M6800-Based GPIB Interface'']], 1977 (PDF)
* [[Media:Ax-3607.pdf|AX-3607: S. C. Baunach, ''An Example of an M6800-Based GPIB Interface'']], 1977 (PDF)
* [[Media:Floating Oscilloscope Measurements 1981.pdf|''Floating Oscilloscope Measurements ... And Operator Protection'']], 1981 (PDF)  ''(→ [[A6902]])''
* [[Media:Floating Oscilloscope Measurements 1981.pdf|''Floating Oscilloscope Measurements ... And Operator Protection'']], 1981 (PDF)  ''(→ [[A6902]])''
* [[Media:26W-4889.pdf|26W-4889: ''No Loose Ends - Revised - The Tektronix Proof-of-Performance Program for CATV'']], 1982 (PDF)    ''(→  [[7L12]] [[7L14]] [[147]] [[1430]])''
* [[Media:42W-5334.pdf|42W-5334: ''Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In'']], 1983 (PDF, OCR)    ''(→  [[7854]] [[7S12]])''
* [[Media:42W-5334.pdf|42W-5334: ''Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In'']], 1983 (PDF, OCR)    ''(→  [[7854]] [[7S12]])''
* [[Media:42W-6694.pdf|42W-6694: ''High Frequency Wafer Probing'']], 1987 (PDF, OCR)    ''(→ [[7854]])''
* [[Media:42W-6694.pdf|42W-6694: ''High Frequency Wafer Probing'']], 1987 (PDF, OCR)    ''(→ [[7854]])''

Revision as of 14:04, 20 November 2020

"Digital Application Notes"