Application Notes: Difference between revisions

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(added number for Floating Oscilloscope Measurements 1981)
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* [[Media:42W-5334.pdf|42W-5334: ''Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In'']], 1983 (PDF, OCR)    ''(→  [[7854]] [[7S12]])''
* [[Media:42W-5334.pdf|42W-5334: ''Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In'']], 1983 (PDF, OCR)    ''(→  [[7854]] [[7S12]])''
* [[Media:42W-6694.pdf|42W-6694: ''High Frequency Wafer Probing'']], 1987 (PDF, OCR)    ''(→ [[7854]])''
* [[Media:42W-6694.pdf|42W-6694: ''High Frequency Wafer Probing'']], 1987 (PDF, OCR)    ''(→ [[7854]])''
* [[Media:Floating Oscilloscope Measurements 1981.pdf|60AX-4741: ''Floating Oscilloscope Measurements ... And Operator Protection'']], 1981 (PDF)  ''(→ [[A6902]])''
* [[Media:Floating Oscilloscope Measurements 1981.pdf|60AX-4741: ''Floating Oscilloscope Measurements ... And Operator Protection'']], 1981 (PDF)  ''(→ [[A6901]] [[A6902]] [[221]])''
* [[Media:85W-8885-0.pdf|85W-8885-0: ''TDR Tools in Modeling Interconnects and Packages'']], 1993  (PDF, OCR)
* [[Media:85W-8885-0.pdf|85W-8885-0: ''TDR Tools in Modeling Interconnects and Packages'']], 1993  (PDF, OCR)
* [[Media:Tek z-profile algorithm.pdf|85W-8882-0: ''Z-Profile Algorithm'']], 1993 (PDF, OCR)
* [[Media:Tek z-profile algorithm.pdf|85W-8882-0: ''Z-Profile Algorithm'']], 1993 (PDF, OCR)

Revision as of 21:38, 20 November 2020

"Digital Application Notes"