S-3100: Difference between revisions

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The '''Tektronix S-3100''' is a family of automated test systems, introduced at WESCON in July 1967.
They use a package consisting of a [[568|568 programmable readout oscilloscope]],
dual channel vertical sampling plug-ins ([[3S5]]/[[3S6]]),
and delaying sweep time bases ([[3T5]]/[[3T6]]), plus a digital readout unit ([[230]]).
==Link==
* [[Media:S-3100 Series Brochure.pdf|S-3100 Series Brochure (PDF)]]
* [http://w140.com/tek_s-3100_1968_catalog.pdf Tektronix S-3100 in 1968 Catalog (PDF)]
* [http://w140.com/tek_s-3100_1968_catalog.pdf Tektronix S-3100 in 1968 Catalog (PDF)]
* [http://w140.com/tek_s-3110_1968_cat.pdf Tektronix S-3110 in 1968 Catalog (PDF)]
* [[Media:070-3065-00.pdf|Automated Measurement Systems: System Calibration Introduction (PDF)]]
* [[Media:Tek s-3101 from 1964-1965 american microelectronics data annual.pdf|Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual (PDF)]]


==Pictures==
<gallery>
<gallery>
File:Tek s-3100.jpg|Photo from 1968 Catalog
Tek s-3100.jpg|Photo from 1968 Catalog
File:S3100_block.png|Block Diagram
S3100_block.png|Block Diagram
</gallery>
</gallery>




[[Category:Controllers]]
[[Category:Automated test systems]]
[[Category:Introduced in 1967]]

Revision as of 08:11, 13 April 2021

The Tektronix S-3100 is a family of automated test systems, introduced at WESCON in July 1967.

They use a package consisting of a 568 programmable readout oscilloscope, dual channel vertical sampling plug-ins (3S5/3S6), and delaying sweep time bases (3T5/3T6), plus a digital readout unit (230).

Link

Pictures