S-3100: Difference between revisions

From TekWiki
Jump to navigation Jump to search
(Created page with "* [http://w140.com/tek_s-3100_1968_catalog.pdf Tektronix S-3100 in 1968 Catalog (PDF)]")
 
No edit summary
(9 intermediate revisions by 4 users not shown)
Line 1: Line 1:
* [http://w140.com/tek_s-3100_1968_catalog.pdf Tektronix S-3100 in 1968 Catalog (PDF)]
{{Instrument Sidebar
|manufacturer=Tektronix
|model=S-3100
|class=Signal processing system
|series=
|summary=Signal processing system
|image=Tek s-3100.jpg
|caption=Tektronix S-3100 Signal processing system (Photo from 1968 Catalog)
|introduced=1967
|discontinued=(?)
|designers=
|manuals=
* ''please add'' [[Category:Manual needed]]
}}
The '''Tektronix S-3100''' is a family of automated test systems, introduced at WESCON in July 1967.
 
They use a package consisting of a [[568|568 programmable readout oscilloscope]],
dual channel vertical sampling plug-ins ([[3S5]]/[[3S6]]),
and delaying sweep time bases ([[3T5]]/[[3T6]]), plus a digital readout unit ([[230]]).
 
==Link==
* [[Media:S-3100 Series Brochure.pdf|S-3100 Series Brochure (PDF)]]
* [https://w140.com/tek_s-3100_1968_catalog.pdf Tektronix S-3100 in 1968 Catalog (PDF)]
* [https://w140.com/tek_s-3110_1968_cat.pdf Tektronix S-3110 in 1968 Catalog (PDF)]
* [[Media:070-3065-00.pdf|Automated Measurement Systems: System Calibration Introduction (PDF)]]
* [[Media:Tek s-3101 from 1964-1965 american microelectronics data annual.pdf|Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual (PDF)]]
 
==See Also==
* [[015-0139-00]] input-output panel
 
==Pictures==
<gallery>
Tek s-3100.jpg|Photo from 1968 Catalog
S3100_block.png|Block Diagram
</gallery>
 
 
[[Category:Automated test systems]]

Revision as of 12:20, 2 August 2022

Tektronix S-3100
Signal processing system
Tektronix S-3100 Signal processing system (Photo from 1968 Catalog)

Produced from 1967 to (?)

Manuals
  • please add
(All manuals in PDF format unless noted otherwise)
Manuals – Specifications – Links – Pictures

The Tektronix S-3100 is a family of automated test systems, introduced at WESCON in July 1967.

They use a package consisting of a 568 programmable readout oscilloscope, dual channel vertical sampling plug-ins (3S5/3S6), and delaying sweep time bases (3T5/3T6), plus a digital readout unit (230).

Link

See Also

Pictures