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DATA ACQUISITION AND PROCESSING ON ELECTRON BEAM FUSION ACCELERATORS (1) ·
Evaluating Digital IC Performance Using the 576 Curve Tracer (1) ·
Measuring Jitter with a Sampling Oscilloscope (1) ·
Overview of the Instrument Control and Data Reduction Software in the Sandia Data Acquistion System at the Nevada Test Site (1) ·
Progress in Semiconductor Testing (1) ·
Random Sampling - A New Way of Fast Pulse Display (1) ·
Semiautomatic Testing with the Curve Tracer (1) ·
The State of the Art in Sampling (1)
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Sampling (1)
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