Drilldown: Documents

Article (7)

Jan-1978-Engr-News (1) · Technology Report FEB1980 P7 (1) · Tek Forum Report N4 P6 (1) · Tekscope V10 N3 P10 (1) · Tekscope V3 N3 P10 (1) · Tekscope V4 N3 P10 (1) · Tekscope V4 N6 P2 (1)

Jan-1978-Engr-News.pdf (1) · Technology Report February 1980.pdf (1) · Tek_forum_report_4.pdf (1) · Tekscope 1971 V3 N3.pdf (1) · Tekscope 1972 V4 N3 May 1972.pdf (1) · Tekscope 1972 V4 N6 Nov 1972.pdf (1) · Tekscope 1978 V10 N3.pdf (1)

None (1) · 10 (3) · 2 (1) · 6 (1) · 7 (1)

A 24 MHz Nyquist SAW Filter for the 1450 Demodulator (1) · Evaluating Digital IC Performance Using the 576 Curve Tracer (1) · Patent Received: 4,096,455 Surface Wave Termination for Surface Wave Device (1) · Progress in Semiconductor Testing (1) · Recent Advances in Direct View Storage Tubes (1) · Semiautomatic Testing with the Curve Tracer (1) · Surface Acoustic Wave (SAW) Technology (1)

None · Charles Phillips · Morris Engelson · Fred Beckett · Charlie Rhodes · John Mulvey · Al Zimmerman · Bob Beville · Bill Drummond · Bruce Ableidinger · Dale Aufrecht · Emory Harry · Fred Telewski · Jack Millay · James R. Andrews · Jerry Shannon · Kenneth L. Arthur · Les Hurlock · Ron Lang · Val Garuts

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1971 (1) · 1972 (2) · 1977 (1) · 1978 (1) · 1979 (1) · 1980 (1)

1450 (2) · 172 (1) · 177 (1) · 178 (1) · 576 (2) · 577 (1) · CRTs (1) · Curve tracers (1) · Direct-view storage CRT (1) · Patent US 4096455A (1) · Transfer storage CRT (1)