Drilldown: Documents

Article (7) · Book (2)

062-1009-00 (1) · 062-1172-00 (1) · Technology Report FEB1980 P7 (1) · Technology Report MAR1980 P15 (1) · Tek Forum Report N4 P6 (1) · Tekscope V10 N3 P10 (1) · Tekscope V5 N3 P2 (1) · Tekscope V6 N3 P3 (1) · Tekscope V8 N1 P17 (1)

062-1009-00.pdf (1) · 062-1172-00.pdf (1) · Technology Report February 1980.pdf (1) · Technology Report March 1980.pdf (1) · Tek_forum_report_4.pdf (1) · Tekscope 1973 V5 N3 May 1973.pdf (1) · Tekscope 1974 V6 N3.pdf (1) · Tekscope 1976 V8 N1.pdf (1) · Tekscope 1978 V10 N3.pdf (1)

None (2) · 10 (1) · 15 (1) · 17 (1) · 2 (1) · 3 (1) · 6 (1) · 7 (1)

A 24 MHz Nyquist SAW Filter for the 1450 Demodulator (1) · Circuit Concepts: Sampling Oscilloscope Circuits (1) · Measurement Concepts: Semiconductor Device Measurements (1) · Patent Received: 4,096,455 Surface Wave Termination for Surface Wave Device (1) · Patent Received: 4,163,948 Glitch Filter for D/A Converter (1) · Surface Acoustic Wave (SAW) Technology (1) · The 31/53 Calculator-based Measurement Instrumentation Package (1) · The Simple Sampling Oscilloscope (1) · Troubleshooting Phase Lock Loops (1)

None · Charles Phillips · Morris Engelson · Gary P. Laroff · Cathy Cramer · Patricia Kelley · Dave Barnard · Fred Beckett · Charlie Rhodes · John Mulvey · Terry Davis · Al Zimmerman · Bob Beville · Bob Haas · Dale Aufrecht · Miki Tokola · Bill Drummond · Bruce Ableidinger · Emory Harry · Fred Telewski

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1969 (1) · 1970 (1) · 1973 (1) · 1974 (1) · 1976 (1) · 1978 (1) · 1979 (1) · 1980 (2)

1450 (2) · 153 (1) · 31 (1) · 5S14N (1) · 7S14 (1) · Curve tracers (1) · DC503 (1) · DM501 (1) · Patent US 4096455A (1) · Patent US 4163948A (1) · Sampling (1) · TG501 (1) · Tunnel diodes (1)