7854 On-board Digital Processing Refines Scope Measurements 7854 Waveform Calculator Keyboard Guide 7D11+7D15 Marketing Sales Release A 1000 cm/μs Storage Oscilloscope A 16-channel Logic Analyzer for the 7000 Series A 24 MHz Nyquist SAW Filter for the 1450 Demodulator A 400-MHz Dual-Beam Oscilloscope A 5 MHz Digitally-Controlled Spectrum Analyzer A 50-MHz Pulse Generator with Variable Transition Times A Basic Logic Review A Big Step Forward for Direct-View Storage A Close-up Look at the CRT A Desk-top Graphic Computing System A Display Formatter – The Indispensable Tool for the Data Domain A Dual-beam Family A Dynamic Angular Transducer for Oscilloscope Display of Rotation-Related Phenomena A Fast Unidirectional TTY Interface for a Minicomputer A First Converter With Field Replaceable Diodes A Hand-held DMMiniscope A High Performance Transportable Microwave Spectrum Analyzer A High Resolution Color Picture Monitor for Television and Laboratory Use A High-stability 100 KHz to 1.8 GHz Tracking Generator A Microprocessor Development Lab with an Expandable Future A Microwave Spectrum Analyzer for the 7000-Series Oscilloscopes A Multi-Function Digital Service Instrument A Multiple-User Software Development Unit A Nanosecond Portable Oscilloscope A New 50-MHz Oscilloscope A New Approach to Fast Gate Design A New Calibration Fixture for the 7000-Series A New Concept in Data Representation: The Complete Integration of Graphics and Alphanumerics A New Cost-Effective Highly Portable Data Comm Tester A New DMM Family for the TM 500 Series A New Dimension in Curve Tracing A New Insight Into Reciprocating Machinery A New Logic for Oscilloscope Displays A New Look in Information Display A New Low-cost 500 MHz Probe A New NTSC Graticule for the 1480 Waveform Monitor (TV Products App Note No.20) A New Series of Small Microcontroller Boards A New Vectorscope A New Way to Look At Transients A Phase Lock Stabilization System for 30 Hz Resolution at 12 GHz A Plug-in Word Recognizer with Digital Delay A Portable High-Performance Microwave Spectrum Analyzer A Potpourri of Modifications and Service Hints A Potpourri of Servicing Aids A Powerful New Tool for Integrating Microcomputer Hardware and Software A Practical Approach to Differential Amplifiers and Measurements A Practical Approach to Regulated Power Supplies as Operational Amplifiers A Practical Approach to Transistor and Vacuum Tube Amplifiers, Part 1 - The Transistor Amplifier A Practical Approach to Transistor and Vacuum Tube Amplifiers, Part 2 - The Vacuum Tube Amplifier A Practical Approach to Transistor and Vacuum Tube Amplifiers, Part 3 - A DC Analysis of a Typical Tektronix Hybrid Circuit A Programmable Data Communications Tester for First-Line Technicians A Quick-Cal Procedure for the 520 Vectorscope A Radically New Coaxial Connector for the Laboratory A Real-Time Debugging Tool for the 8500 Series MDL A Review of Basic Counter Principles A Simplified Oscilloscope for the Operating Room A Subnanosecond Realtime Oscilloscope A Switching Power Supply For The 492 Spectrum Analyzer A User-Programmable Logic Analyzer for Microprocessor Design A Wide Choice of Pulses A fast A/D plug-in for the oscilloscope ABCs of Probes (Primer) Advanced Triggering Techniques Amplitude Measurement to Better Than 1% An Automatic Video Signal Parameter Measuring Instrument with Logging Capabilities An Easy Language for Talking with Color Machines An Example of an M6800-Based GPIB Interface An Extended Value An Intelligent, Programmable Transient Digitizer An Ultra-Stable Precision Demodulator for the Television Broadcaster Automated Measurement Systems Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In Automatic Distortion Analyzer Speeds Distortion Measurements Basic Functions of Attenuators, Terminations, and Adapters Basic Sampling Basic software programs for communicating between the 7854 and IBM PC CRT READOUT – Nicety or Necessity? Cable TV Measurements Using the 2714/2715 Spectrum Analyzers Calibration and Troubleshooting Aids for the 1401A Circuit Concepts from Tektronix Circuit Concepts: Cathode-ray tubes Circuit Concepts: Horizontal Amplifier Circuits Circuit Concepts: Oscilloscope Probe Circuits Circuit Concepts: Oscilloscope Trigger Circuits Circuit Concepts: Power Supply Circuits, 2nd ed. Circuit Concepts: Sampling Oscilloscope Circuits Circuit Concepts: Spectrum Analyzer Circuits Circuit Concepts: Storage Cathode-Ray Tubes and Circuits, 2nd ed. Circuit Concepts: Sweep Generator Circuits Circuit Concepts: Television Waveform Processing Circuits Circuit Concepts: Vertical Amplifier Circuits Clearing Up the 7623 Storage Picture Codes and Formats Standard Adds Compatibility and Capability to IEEE-488 Instruments Computerized, Wide-Bandwidth, Multichannel, Soft X-Ray Diode Spectrometer for High Density Plasma Diagnosis Configurable State-of-the Art Logic Analyzer Gives Choice of Performance Counter and Oscilloscope Combination Makes Difficult Measurements Crystal Device Measurements Using the Spectrum Analyzer Curve Tracing Displays Customer Training at Tektronix Cyber TESLA Version 2 Released DATA ACQUISITION AND PROCESSING ON ELECTRON BEAM FUSION ACCELERATORS Data Communication Basics Delayed Gate Aids Oscilloscope Digital Measurements Delaying Sweep Goes Digital Delta Time Measurement for the 7000 Series Designing a New Price/Performance Standard for Portable Oscilloscopes Developing a Practical Automatic Television Parameter Measuring and Logging System Developing a Writing Speed Specification Developing an Information Age Technology Differential Amplifiers and Measurements, Part 2 Digital Concepts Digital Counter and Multimeter Digital Delay and Time Base in One Plug-in Digital Storage and Plug-in Versatility Distinguish New 10-MHz 5000-Series Oscilloscope Digital Storage for a Microwave Spectrum Analyzer Digital Waveform Processing in a High-Performance 7000-Series Oscilloscope Digitizing and displaying fast pulses Direct-View Bistable-Storage CRT Resolution Display Monitors – Through the Looking Glass Dual-Trace Time Difference Measurements with Sampling Dynamic Graphics Gives Best of Both Stored and Refreshed Display Techniques EMI Applications Using the Spectrum Analyzer Easier Waveform Photography Eight-pen Option Brings Automatic Pen Changes to the 4662 Plotter Engine Analyzer System Engineer V Profile: Charlie Rhodes Enhanced Performance Transient Digitizer, the LM7912 Evaluating Digital IC Performance Using the 576 Curve Tracer Evaluating Test Data with Computer Graphics Expanding Your Microwave Measurement Window FM Broadcast Measurements Using the Spectrum Analyzer Features Comparison of Tektronix Curve Tracers Versus HP4145A Semiconductor Parameter Analyzer (Tek internal) Firmware Production and Maintenance Flexible Disc Measurements Simplified by Digital Delay Floating Oscilloscope Measurements ... And Operator Protection Floating-Point Standard Implemented in TESLA Frequency Stabilization Techniques Fundamentals of Spectrum Analysis GPIB Interface Functions and Messages (1) GPIB Interface Functions and Messages (2) Getting Around in Tektronix Instruments Graphing With the 4051 Graphic Computing System Hard Copy - Big Business for Tektronix Hazardous Material Identification High Frequency Wafer Probing High-Speed Transient Recording System History of the Information Display Division Human pattern recognition speeds automated testing IEEE 488 Bus - Going Your Way? Improvement of the Bandwidth of the Transient Digitizers in the LIDAR Thomson Scattering Diagnostic on JET Increased Measurement Accuracy Using a 7D15 Universal Counter/Timer in any 7000 Series Oscilloscope Information Display Concepts Instruction Manuals, a Service Technician's Best Friend Interactive Graphics Interpreting Markings on Semiconductor Components Introducing the New Generation Introduction to 7854 Oscilloscope Measurement and Programming Techniques Jack Murdock obituary Linear IC Testing Comes to the Curve Tracer Making Measurements with the 492 Making the Correct Semiconductor Measurements Time After Time Measurement Concepts: Automated Testing Systems Measurement Concepts: Biophysical Measurements Measurement Concepts: Engine Analysis Measurement Concepts: Probe Measurements Measurement Concepts: Semiconductor Device Measurements Measurement Concepts: Television Systems Measurement Concepts: Time-Domain Reflectometry Measurements Measurement Concepts: Transducer Measurements Measurement Variety. An Engineering Challenge Featuring the 7854 Measuring Convential Oscilloscope Noise Measuring Distortions in the Television Signal Measuring FETs with a Type 575 Measuring Harmonic Distortion with a Spectrum Analyzer Measuring Jitter with a Sampling Oscilloscope Measuring Return-Loss Measuring the Linearity of Fast Ramps Merging High Performance Alphanumerics and Graphics with Fast Computation Microwave Technology at Tektronix Modular Electronic Instrument Cabinets Lower Costs Multiburst Testing with the 1470 (TV Products App Note No.23) New From Tektronix, Inc. In 1967 New Portables New and Improved Coaxial Connectors Nickel-Cadmium Battery Rev1ew No Loose Ends - Revised - The Tektronix Proof-of-Performance Program for CATV Numerical Control Opamp Bandwidth Approximations ... using the 577/178 Curve Tracer Optimizing Mixer Performance Using the 7L12 Spectrum Analyzer Oscilloscope Camera Concepts Oscilloscope to Curve Tracer with One Plug-in Overview of the Instrument Control and Data Reduction Software in the Sandia Data Acquistion System at the Nevada Test Site P6042 DC-to-50 MHz Current Probe P6046 DC-to-100 MHz Differential Probe and Amplifier Packaging A Spectrum Analyzer for Performance, Maintainability and Survival Parameter Entry Device Simplifies Plotter Set-up and Servicing Patent Received: 4,096,455 Surface Wave Termination for Surface Wave Device Patent Received: 4,109,182 Simultaneous Delayed Sweep Display Patent Received: 4,135,201 Dynamic Damping for SECAM High-Frequency De-Emphasis Patent Received: 4,146,844 Feed-Forward Amplifier Patent Received: 4,146,846 Amplifier Havin a High Frequency Boost Network Patent Received: 4,151,444 Voltage Switching Circuit Improves Color Display Patent Received: 4,153,518 Thin-Film Barrier Helps Fabricate Metallized Substrates Patent Received: 4,159,439 New CRT Display Decreases Background Luminance Patent Received: 4,160,276 Negative Impedance Terminator Improves Aperture Corrector Patent Received: 4,163,948 Glitch Filter for D/A Converter Plug-on Versatility Plugins to Reach the Limits of your Imagination Portable Analyzer Speeds Test and Service of Microprocessor-Based System Portable Power Portable Precision - Redefined Power Electronics Measurements Made Easy with TDS Oscilloscopes Power Supply/Device Testing Preserving Scope Bandwidth and Sensitivity Preventing Sampling Head Overdrive and Static Damage Programmable Calibration Generator Speeds Instrument Checkout Progress in Semiconductor Testing Pulse Generator or Function Generator - Making an Intelligent Choice Pulsed Signal Spectrum Analysis Pulsed-Collector High-Current Testing with the 176 Questions for guest speakers Quick Check for Tunnel Diodes Random Noise Measurement with the Spectrum Analyzer Random Sampling - A New Way of Fast Pulse Display Random Sampling Oscilloscope Time Base Random Sampling Oscilloscope for the Observation of Mercury Switch Closure Transition Times Reading Capacitor Codes Reducing Risks in Designing With LSI Reliability-the Continuing Challenge Repairing pushbutton switches Replacing Probe Tips, Bodies, and Boots Schematic Reading and Component Familiarization Scope Evaluation Guide & Circuit Board Instructions Semiautomatic Testing with the Curve Tracer Service Notes - Optimizing System Risetime (1S2) Servicing 5100-Series Display Units Servicing the 432/434 Oscilloscopes Servicing the 465 Portable Oscilloscope Servicing the 7000-Series Logic and Readout Servicing the 7704 CRT Circuit Servicing the 7704 High-Efficiency Power Supply Servicing the 7904 high-efficiency power supply Servicing the C12, C13, C19 and C27 Cameras Servicing the Sweep Circuit in the 7T11 Sampling Sweep Unit Servicing the Telequipment D67 Oscilloscope Servicing the Trigger Circuit in the 7T11 Sampling Sweep Unit Short Pulse Technique of Adjusting Wideband Amplifiers Shortening the Blanking Intervals of the Tektronix 140-144-146 NTSC Generators (TV Products App Note No.22) Signal Generation and Conditioning with a New Modular System Silver-Bearing Solder and Silver Solder: Two Different Things Simplify Waveform Measurements Simultaneous X-Y, Y-T Displays Using a 5100-Series Oscilloscope Slewed-Edge Signals Simplify Fast Sweep Timing Software Innovations Increase Productivity of Desktop Computer Users Soldering Tektronix Circuit Boards Some Experiences in IC Testing Some Thoughts from a System Builder Specifying Product Performance Spectrum Analysis utilizing Waveguide Mixers Spectrum Analyzer Applications in Baseband Measurements Spectrum Analyzer Fundamentals Spectrum Analyzer Techniques for Frequency Stability Measurements Spectrum analyzers require high technology Spotlighting Hidden Pulses Storage Display Instruments Storage Expands Your Oscilloscope Measurement Capabilities Strain Gage Measurement Concepts Sweep Delay Today System Sweep Use and Documentation TDR Tools in Modeling Interconnects and Packages TEK SPS BASIC – Modular Software for Instrument Control TEKCOM: A Cyber-based Electronic Mail System TM 5000-A New Family of IEEE-488 Programmable Instruments TM500 Power Module Tester and Utility Power Supply TM500 series - A New Dimension in Plug-in Instrumentation Taking the Delay out of Delaying Sweep Measurements Talking to the 7854 scope with TEK SPS BASIC. TekMAP 7854 Time and Amplitude Measurement Software Tektronix 7854TDR and 7854MPS measurement packages Tektronix Curve Tracers - Device Testing Techniques Tektronix Looks at Light Tektronix Measurement Systems Tektronix Products Get Dirty, Too! Part 1 - Wet washing Tektronix Products Get Dirty, Too! Part 2 - Dry cleaning, cam switches Tektronix R7912 Programmable Transient Waveform Digitizer Tektronix Signal Sources Tektronix Storage Tubes Tektronix and the World of Television Measurements Tektronix oscilloscopes (IBM Customer Engineering Manual) Testing Component Video Systems Testing Optoisolators Testing Three-Terminal Regulators with a Curve Tracer Testing and Using Synchronous Demodulators The 31/53 Calculator-based Measurement Instrumentation Package The 4027 - Adding a Color Dimension to Graphics The 4662 - A New Concept: Interactive Digital Plotting The 4663 - Large Plotter Capability with Small Plotter Convenience The 7000-Series Oscilloscopes as Signal Sources The 7704A – Extended Performance Plus Modularity The 7D14 Counts Current to Minimize Circuit Loading The 8002 – A New Design Tool for Microprocessor Users The ABCs of Probes The Auxiliary Video Facility of the 1480-Series of Waveform Monitors (TV Products App Note No.17) The FET takes its place The FG504 - A New Standard in Function Generators The Fundamental Beauty of Computer Graphics The Logic Probe and the Oscilloscope The Low-Frequency Oscilloscope Goes Plug-in The New Look in Portables The New Portables The Oscilloscope and Transducer Measurements The Oscilloscope with Computing Power The Oscilloscope with the Digital Multimeter The Oscilloscope-controlled Counter The R1340 Data Coupler The Simple Sampling Oscilloscope The Spectrum Analyzer and the Earth Station The State of the Art in Sampling The T900 Series – Solving the Cost vs Quality Question The TM500 Mobile Test Lab The Tektronix 492 Is A New-Generation Spectrum Analyzer The Tektronix Cookbook of Standard Audio Tests using the 5L4N Low Frequency Spectrum Analyzer The Tektronix Scientist 909 The Virtual Bit Map Brings High Resolution Graphics to the Alphanumerics Terminal User Three Kinds of Storage Three New Portable Oscilloscopes Designed for Field Service Use Time measurements to better than 1% Time-Domain Reflectometry Theory and the Testing of Coaxial Transmission Lines Transition Counting with an Oscilloscope Transmission Line Characteristics ... A Review Triggering the oscilloscope from logic signals Troubeshooting the Amplifiers Troubleshooting Digital Circuits, Part 1 Troubleshooting Digital Circuits, Part 2 Troubleshooting Phase Lock Loops Troubleshooting Preamplifiers Troubleshooting Sampling Systems Troubleshooting Sampling Systems, Part 2 Troubleshooting Tektronix High-Frequency Spectrum Analyzers Troubleshooting Your Oscilloscope Troubleshooting a Microprocessor (Logic Analyzer App Note #57K1.0) Troubleshooting the 453 Troubleshooting the 7B70 and 7B71 Time Bases Troubleshooting the High-Voltage Supply Troubleshooting the Power Supply Troubleshooting the Sweep Ciruits Troubleshooting the Trigger Circuits Tunnel Diodes: In-Circuit Testing Using the 7D13 Digital Multimeter Plug-In Turning Easily From One Thing to Another Two Bright Dots on the Sampling Horizon Two Graphics Technologies Merged Two New Graphic Display Modules for the OEM System Designer Two New Graphic Terminals Expand Graphic Capabilities Two New Hard Copy Units Feature Low-Cost, High-Contrast Copies Two Weatherproof TDR Cable Testers for Field Use USB Spectrum Analyzers and SignalVu-PC – Frequently Asked Questions Understanding Delaying Sweep Understanding oscilloscope trigger controls Unraveling the Mystery on the GPIB Updating the Industry-Standard 100 MHz Portable Oscilloscope Useful IC Tools Using the 144 as a Simple Special Effects Generator Using the 7854 in a GPIB configuration Using the Multipulse Waveform to Measure Group Delay and Amplitude Errors Using your oscilloscope probe (Part 1) Using your oscilloscope probe (Part 2) Verifying the Bruch Blanking Sequence (TV Products App Note No.16) Versatile Analogue Chip for Oscilloscope Plug-ins Vertical Interval Test Signals - Reprogramming Tektronix Signal Generators (TV Products App Note No.19) Video Copiers Viewing Fast Transitions at Slow Sweep Speeds WP1310 Signal Processing System WP1310 Waveform Processing System Washing Your Tektronix Instrument We Go Where You Go With Lab Quality Spectrum Analysis What You Need to Know About Testing 4k MOS Memories Wire-Wrap for Hi-Speed Logic Circuits X-Y Displays with Interval Timing for Measuring SOA XYZs of Oscilloscopes (Primer) Z-Profile Algorithm
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Measurement Concepts: Time-Domain Reflectometry Measurements 
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