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Documents > Authors : John Mulvey or Robert R. Zimmerman

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Class:
Article (4) · Book (2)
Identifier:
062-1009-00 (1) · 062-1172-00 (1) · Technology Report NOV1979 P23 (1) · Tekscope V5 N3 P2 (1) · Tekscope V6 N3 P3 (1) · Tekscope V8 N1 P17 (1)
File:
062-1009-00.pdf (1) · 062-1172-00.pdf (1) · Technology Report November 1979.pdf (1) · Tekscope 1973 V5 N3 May 1973.pdf (1) · Tekscope 1974 V6 N3.pdf (1) · Tekscope 1976 V8 N1.pdf (1)
PageNumber:
None (2) · 17 (1) · 2 (1) · 23 (1) · 3 (1)
Title:
Circuit Concepts: Sampling Oscilloscope Circuits (1) · Measurement Concepts: Semiconductor Device Measurements (1) · Patent Received: 4,153,518 Thin-Film Barrier Helps Fabricate Metallized Substrates (1) · The 31/53 Calculator-based Measurement Instrumentation Package (1) · The Simple Sampling Oscilloscope (1) · Troubleshooting Phase Lock Loops (1)
Authors: (Click arrow to add another value)
Year:
1969 (1) · 1970 (1) · 1973 (1) · 1974 (1) · 1976 (1) · 1979 (1)
Links:
153 (1) · 31 (1) · 5S14N (1) · 7S14 (1) · Curve tracers (1) · DC503 (1) · DM501 (1) · Patent US 4153518A (1) · Sampling (1) · TG501 (1) · Tunnel diodes (1)

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