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- Companies (66)
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- Documents (450)
- Patents (1678)
- Persons (327)
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Class: (Click arrow to add another value)
Identifier:
File:
Boyer data acq ebeam fus acc.pdf (1) ·
GenRad Experimenter V.34 No.7-8, July-Aug 1960.pdf (1) ·
Service Scope 46 Oct 1967.pdf (1) ·
Service Scope 48 Feb 1968.pdf (1) ·
Service Scope 52 Oct 1968.pdf (1) ·
Service Scope 53 Dec 1968.pdf (1) ·
Service scope dec 1968 ocr.pdf (1) ·
Technology Report March 1980.pdf (1) ·
Technology Report November 1979.pdf (1) ·
Technology Report October 1979.pdf (1) ·
Tekscope 1970 V2 N2 Apr 1970.pdf (1) ·
Tekscope 1970 V2 N4 Aug 1970.pdf (1) ·
Tekscope 1971 V3 N2.pdf (1) ·
Tekscope 1971 V3 N3.pdf (1) ·
Tekscope 1972 V4 N3 May 1972.pdf (1) ·
Tekscope 1973 V5 N2 Mar 1973.pdf (1) ·
Tekscope 1973 V5 N3 May 1973.pdf (1) ·
Tekscope 1974 V6 N3.pdf (1) ·
Tekscope 1975 V6 N1.pdf (1) ·
Tekscope 1975 V7 N2.pdf (1) ·
Tekscope 1975 V7 N4.pdf (1) ·
Tekscope 1975 V7 N5.pdf (1) ·
Tekscope 1976 V8 N1.pdf (1) ·
Tekscope 1976 V8 N2.pdf (1) ·
Tekscope 1976 V8 N3.pdf (1) ·
Tekscope 1976 V8 N4 with Supplement.pdf (1) ·
Tekscope 1977 V9 N2.pdf (1) ·
Tekscope 1978 V10 N1.pdf (1) ·
Tekscope 1978 V10 N3.pdf (1) ·
Tekscope 1979 V11 N1.pdf (1) ·
Tekscope 1979 V11 N2.pdf (1) ·
Tekscope 1979 V11 N3.pdf (1) ·
Tekscope_1981_V13_N2.pdf (1) ·
Tekscope_1981_V13_N3.pdf (1) ·
Tekscope_1982_V14_N1.pdf (1)
PageNumber: (Click arrow to add another value)
Title:
A 50-MHz Pulse Generator with Variable Transition Times (1) ·
A High Resolution Color Picture Monitor for Television and Laboratory Use (1) ·
A New 50-MHz Oscilloscope (1) ·
A New Concept in Data Representation: The Complete Integration of Graphics and Alphanumerics (1) ·
A New DMM Family for the TM 500 Series (1) ·
A Powerful New Tool for Integrating Microcomputer Hardware and Software (1) ·
An Intelligent, Programmable Transient Digitizer (1) ·
Codes and Formats Standard Adds Compatibility and Capability to IEEE-488 Instruments (1) ·
Cyber TESLA Version 2 Released (1) ·
DATA ACQUISITION AND PROCESSING ON ELECTRON BEAM FUSION ACCELERATORS (1) ·
Dual-Trace Time Difference Measurements with Sampling (1) ·
GPIB Interface Functions and Messages (2) (1) ·
Instruction Manuals, a Service Technician's Best Friend (1) ·
Interpreting Markings on Semiconductor Components (1) ·
Measuring Harmonic Distortion with a Spectrum Analyzer (1) ·
New Products (5) ·
P6046 DC-to-100 MHz Differential Probe and Amplifier (1) ·
Patent Received: 4,151,444 Voltage Switching Circuit Improves Color Display (1) ·
Patent Received: 4,160,276 Negative Impedance Terminator Improves Aperture Corrector (1) ·
Reducing Risks in Designing With LSI (1) ·
Repairing pushbutton switches (1) ·
Replacing Graticule Lights (2) ·
Service Notes - Optimizing System Risetime (1S2) (1) ·
Servicing the 465 Portable Oscilloscope (1) ·
Servicing the 7704 CRT Circuit (1) ·
Servicing the 7704 High-Efficiency Power Supply (1) ·
Servicing the Sweep Circuit in the 7T11 Sampling Sweep Unit (1) ·
Servicing the Trigger Circuit in the 7T11 Sampling Sweep Unit (1) ·
Some Thoughts from a System Builder (1) ·
Spectrum Analyzer Applications in Baseband Measurements (1) ·
Tektronix Products Get Dirty, Too! Part 1 - Wet washing (1) ·
The T900 Series – Solving the Cost vs Quality Question (1) ·
The Use of the General Radio Immittance Bridge in Tunnel-Diode Measurements (1) ·
The Virtual Bit Map Brings High Resolution Graphics to the Alphanumerics Terminal User (1) ·
Troubleshooting Sampling Systems (1) ·
Troubleshooting the 453 (1) ·
Two Graphics Technologies Merged (1) ·
Updating the Industry-Standard 100 MHz Portable Oscilloscope (1) ·
Using your oscilloscope probe (Part 2) (1)
Authors:
None (11) ·
Arnold Farley (1) ·
Bill Mark (1) ·
Bob Cram (1) ·
Charles Ceranowski (1) ·
Charles Phillips (7) ·
Dale Aufrecht (1) ·
Dan Baker (1) ·
Don Hall (1) ·
E.Adler (1) ·
Glenn Bateman (1) ·
Harold Busch (1) ·
Jack Liskear (1) ·
Jim Hinze (1) ·
Joe Hallett (1) ·
John Horn (1) ·
Ken Lindsay (2) ·
Ken Matheson (1) ·
Morgan Howells (1) ·
Morris Engelson (1) ·
Neil Martin (1) ·
R. Michael Johnson (1) ·
R.C.Wonson (1) ·
Riley Stock (1) ·
Stan Davis (1) ·
Tim Jenness (1) ·
William B. Boyer (1) ·
William Broderick (1) ·
William G. Bevan (1)
Year:
Showing below up to 44 results in range #1 to #44.
F
- Data Acquisition and Processing on Electron Beam Fusion Accelerators - William Boyer 1978.pdf
- GenRad Experimenter V.34 No.7-8, July-Aug 1960.pdf
- Service Scope 46 Oct 1967.pdf
- Service Scope 48 Feb 1968.pdf
- Service Scope 52 Oct 1968.pdf
- Service Scope 53 Dec 1968.pdf
- Service scope dec 1968 ocr.pdf
- Technology Report March 1980.pdf
- Technology Report November 1979.pdf
- Technology Report November 1979.pdf
- Technology Report October 1979.pdf
- Technology Report October 1979.pdf
- Tekscope 1970 V2 N2 Apr 1970.pdf
- Tekscope 1970 V2 N4 Aug 1970.pdf
- Tekscope 1970 V2 N4 Aug 1970.pdf
- Tekscope 1971 V3 N2.pdf
- Tekscope 1971 V3 N3 May 1971.pdf
- Tekscope 1972 V4 N3 May 1972.pdf
- Tekscope 1973 V5 N2 Mar 1973.pdf
- Tekscope 1973 V5 N3 May 1973.pdf
- Tekscope 1973 V5 N3 May 1973.pdf
- Tekscope 1974 V6 N1.pdf
- Tekscope 1974 V6 N3.pdf
- Tekscope 1975 V7 N2.pdf
- Tekscope 1975 V7 N4.pdf
- Tekscope 1975 V7 N5.pdf
- Tekscope 1976 V8 N1.pdf
- Tekscope 1976 V8 N1.pdf
- Tekscope 1976 V8 N1.pdf
- Tekscope 1976 V8 N2.pdf
- Tekscope 1976 V8 N3.pdf
- Tekscope 1976 V8 N4 with Supplement.pdf
- Tekscope 1976 V8 N4 with Supplement.pdf
- Tekscope 1977 V9 N2.pdf
- Tekscope 1978 V10 N1.pdf
- Tekscope 1978 V10 N1.pdf
- Tekscope 1978 V10 N1.pdf
- Tekscope 1978 V10 N3.pdf
- Tekscope 1979 V11 N1.pdf
- Tekscope 1979 V11 N2.pdf
- Tekscope 1979 V11 N3.pdf
- Tekscope 1981 V13 N2.pdf
- Tekscope 1981 V13 N3.pdf
- Tekscope 1982 V14 N1.pdf