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Improved Bias Supply for Tunnel-Diode Picosecond Pulse Generators
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Service Scope 49 P2
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03W-8605
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062-0710-00
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067-1201-99 Construction Note
070-0890-00
070-2088-00.pdf
070-2088-01.pdf
070-2088-04.pdf
071-1046-00
071-1046-01
20W-4177-1
20W-7058
20W-7076
26W-4817-1
26W-4889
26W-5256
26W-5360
26W-5390
26W-7044
26W-7045
26W-7049
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2EW-10598
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42AX-4682
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7854-App
7D11+7D15 Marketing Sales Release
85W-8882-0
85W-8885-0
A-X-2634
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AX-3079
AX-3106
AX-3107
AX-3197
AX-3264
AX-3265
AX-3388
AX-3406-1
AX-3524
AX-3535
AX-3582
AX-3607
AX-3957
AX-4281
AX-4382
AX-4425
AX-4440
AX-4864
Andrews 1970 1
Andrews 1975 1
Andrews 1983 1
Andrews IM-22 No4 1973 P375
CurveTracers1985
DOE/DP40200-19 V25 P20
Electronic Engineering Aug Sep 1988
Engineering News AUG-SEP1979 P12
Engineering News AUG-SEP1979 P14
Engineering News AUG-SEP1979 P2
GE TIS 68-C-019
GR Experimenter V34 N7-8 P3
GR Experimenter V34 N7-8 P9
GR Experimenter Vol.23 No.5 1948-10
GR Experimenter Vol.35 No.10 1961-10
Gentile 1962
Handshake 1986 Winter P8
Handshake Spring 1986
Handshake Winter 1980/1981
IBM 223-6725-2
IEEE Trans Nuclear Science Vol.NS-25, No. 1, Feb 1978 P.501
L'Archeveque 1964
Lamb IDD History 1974
Lockheed LMSC-D628276 P12
Millman Taub 1965
NBSIR73-309
ROTAN ISA 1958
SAND94-0784
SCHEM-1976
Service Scope 38 P1
Service Scope 38 P7
Service Scope 39 P1
Service Scope 42 P2
Service Scope 42 P6
Service Scope 42 P7
Service Scope 43 P2
Service Scope 43 P7
Service Scope 44 P2
Service Scope 46 P10
Service Scope 46 P13
Service Scope 46 P2
Service Scope 46 P7
Service Scope 47 P2
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Service Scope 48 P9
Service Scope 49 P12
Service Scope 49 P14
Service Scope 49 P15
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Service Scope 50 P2
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Service Scope 51 P11
Service Scope 51 P2
Service Scope 51 P8
Service Scope 53 P10
Service Scope 53 P16
Service Scope 53 P2
Service Scope 53 P9
Service Scope N53 Dec 1968 P10
Service Scope N53 Dec 1968 P2
Service Scope N53 Dec 1968 P9
ServiceScope 52 P10
ServiceScope 52 P13
ServiceScope 52 P14
ServiceScope 52 P2
ServiceScope 52 P8
TMNotes Summer 1985
TRANS-1978
Technology Report FEB1980 P10
Technology Report FEB1980 P7
Technology Report JAN1980 P3
Technology Report MAR1980 P13
Technology Report MAR1980 P14
Technology Report MAR1980 P15
Technology Report MAR1980 P3
Technology Report NOV1979 P18
Technology Report NOV1979 P19
Technology Report NOV1979 P23
Technology Report NOV1979 P3
Technology Report NOV1979 P6
Technology Report NOV1979 P9
Technology Report OCT 1979 P10
Technology Report OCT 1979 P16
Technology Report OCT 1979 P18
Technology Report OCT 1979 P19
Technology Report OCT 1979 P4
Technology Report OCT 1979 P9
Tek Retiree News 2012-11
Tekniques V5 N4 4909
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Tektronix Video Copiers brochure 1980
Tekweek 1975-10-10
Turner 1963
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New Products
·
TM500 Series Rear Interface Data Book
·
Digital Systems Come of Age
·
Measurement Concepts: Spectrum Analyzer Measurements
·
Oscilloscope Analysis and Connectivity Made Easy
·
Replacing Graticule Lights
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Verifying Oscilloscope Performance
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1 GHz at 1 mV in a General Purpose Plug-in Oscilloscope
·
100 MHz Portable Oscilloscope Packs Digital Storage Power
·
11300-Series extends the usefulness of analog scopes
·
16-channel Logic Analyzer
·
30 Hz resolution at gigahertz frequencies - a new direction in spectrum analysis
·
4050 Controls New Generation of Programmable Instruments for Measurement Automation
·
4050 Users Share Data Storage and Retrieval in New Tektronix Hard Disk
·
4050E01 Offers Backpack Expansion
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4052 GPIB Programming Guide Now Available
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4052 Helps Interpret Seismic Waveforms
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7000 series brochure, March 1973
·
7000 Series Digital Plug-In Applications
·
7854 Application Programs
Other values:
7854 On-board Digital Processing Refines Scope Measurements
7854 Waveform Calculator Keyboard Guide
7D11+7D15 Marketing Sales Release
A 1000 cm/μs Storage Oscilloscope
A 16-channel Logic Analyzer for the 7000 Series
A 24 MHz Nyquist SAW Filter for the 1450 Demodulator
A 400-MHz Dual-Beam Oscilloscope
A 5 MHz Digitally-Controlled Spectrum Analyzer
A 50-MHz Pulse Generator with Variable Transition Times
A Basic Logic Review
A Big Step Forward for Direct-View Storage
A Close-up Look at the CRT
A Desk-top Graphic Computing System
A Display Formatter – The Indispensable Tool for the Data Domain
A Dual-beam Family
A Dynamic Angular Transducer for Oscilloscope Display of Rotation-Related Phenomena
A Fast Unidirectional TTY Interface for a Minicomputer
A First Converter With Field Replaceable Diodes
A Hand-held DMMiniscope
A High Performance Transportable Microwave Spectrum Analyzer
A High Resolution Color Picture Monitor for Television and Laboratory Use
A High-stability 100 KHz to 1.8 GHz Tracking Generator
A Microprocessor Development Lab with an Expandable Future
A Microwave Spectrum Analyzer for the 7000-Series Oscilloscopes
A Multi-Function Digital Service Instrument
A Multiple-User Software Development Unit
A Nanosecond Portable Oscilloscope
A New 50-MHz Oscilloscope
A New Approach to Fast Gate Design
A New Calibration Fixture for the 7000-Series
A New Concept in Data Representation: The Complete Integration of Graphics and Alphanumerics
A New Cost-Effective Highly Portable Data Comm Tester
A New DMM Family for the TM 500 Series
A New Dimension in Curve Tracing
A New Insight Into Reciprocating Machinery
A New Logic for Oscilloscope Displays
A New Look in Information Display
A New Low-cost 500 MHz Probe
A New NTSC Graticule for the 1480 Waveform Monitor (TV Products App Note No.20)
A New Series of Small Microcontroller Boards
A New Vectorscope
A New Way to Look At Transients
A Phase Lock Stabilization System for 30 Hz Resolution at 12 GHz
A Plug-in Word Recognizer with Digital Delay
A Portable High-Performance Microwave Spectrum Analyzer
A Potpourri of Modifications and Service Hints
A Potpourri of Servicing Aids
A Powerful New Tool for Integrating Microcomputer Hardware and Software
A Practical Approach to Differential Amplifiers and Measurements
A Practical Approach to Regulated Power Supplies as Operational Amplifiers
A Practical Approach to Transistor and Vacuum Tube Amplifiers, Part 1 - The Transistor Amplifier
A Practical Approach to Transistor and Vacuum Tube Amplifiers, Part 2 - The Vacuum Tube Amplifier
A Practical Approach to Transistor and Vacuum Tube Amplifiers, Part 3 - A DC Analysis of a Typical Tektronix Hybrid Circuit
A Programmable Data Communications Tester for First-Line Technicians
A Quick-Cal Procedure for the 520 Vectorscope
A Radically New Coaxial Connector for the Laboratory
A Real-Time Debugging Tool for the 8500 Series MDL
A Review of Basic Counter Principles
A Simplified Oscilloscope for the Operating Room
A Subnanosecond Realtime Oscilloscope
A Switching Power Supply For The 492 Spectrum Analyzer
A User-Programmable Logic Analyzer for Microprocessor Design
A Wide Choice of Pulses
A fast A/D plug-in for the oscilloscope
ABCs of Probes (Primer)
Advanced Triggering Techniques
Amplitude Measurement to Better Than 1%
An Automatic Video Signal Parameter Measuring Instrument with Logging Capabilities
An Easy Language for Talking with Color Machines
An Example of an M6800-Based GPIB Interface
An Extended Value
An Intelligent, Programmable Transient Digitizer
An Ultra-Stable Precision Demodulator for the Television Broadcaster
Audio analyzer system creates automatic test programs – without programming
Automated Measurement Systems
Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In
Automatic Distortion Analyzer Speeds Distortion Measurements
Basic Functions of Attenuators, Terminations, and Adapters
Basic Sampling
Basic Theory and Application of Tunnel Diodes
Basic software programs for communicating between the 7854 and IBM PC
CRT READOUT – Nicety or Necessity?
Cable TV Measurements Using the 2714/2715 Spectrum Analyzers
Calibration and Troubleshooting Aids for the 1401A
Circuit Concepts from Tektronix
Circuit Concepts: Cathode-ray tubes
Circuit Concepts: Horizontal Amplifier Circuits
Circuit Concepts: Oscilloscope Probe Circuits
Circuit Concepts: Oscilloscope Trigger Circuits
Circuit Concepts: Power Supply Circuits, 2nd ed.
Circuit Concepts: Sampling Oscilloscope Circuits
Circuit Concepts: Spectrum Analyzer Circuits
Circuit Concepts: Storage Cathode-Ray Tubes and Circuits, 2nd ed.
Circuit Concepts: Sweep Generator Circuits
Circuit Concepts: Television Waveform Processing Circuits
Circuit Concepts: Vertical Amplifier Circuits
Clearing Up the 7623 Storage Picture
Codes and Formats Standard Adds Compatibility and Capability to IEEE-488 Instruments
Computerized, Wide-Bandwidth, Multichannel, Soft X-Ray Diode Spectrometer for High Density Plasma Diagnosis
Configurable State-of-the Art Logic Analyzer Gives Choice of Performance
Counter and Oscilloscope Combination Makes Difficult Measurements
Crystal Device Measurements Using the Spectrum Analyzer
Curve Tracing Displays
Customer Training at Tektronix
Cyber TESLA Version 2 Released
DATA ACQUISITION AND PROCESSING ON ELECTRON BEAM FUSION ACCELERATORS
Data Communication Basics
Delayed Gate Aids Oscilloscope Digital Measurements
Delaying Sweep Goes Digital
Delta Time Measurement for the 7000 Series
Designing a New Price/Performance Standard for Portable Oscilloscopes
Developing a Practical Automatic Television Parameter Measuring and Logging System
Developing a Writing Speed Specification
Developing an Information Age Technology
Differential Amplifiers and Measurements, Part 2
Digital Concepts
Digital Counter and Multimeter
Digital Delay and Time Base in One Plug-in
Digital Storage and Plug-in Versatility Distinguish New 10-MHz 5000-Series Oscilloscope
Digital Storage for a Microwave Spectrum Analyzer
Digital Waveform Processing in a High-Performance 7000-Series Oscilloscope
Digital pulse-echo techniques for advanced composites
Digitizing and displaying fast pulses
Diode Circuits Handbook
Direct-View Bistable-Storage CRT Resolution
Directional-Coupler Technique for Triggering a Tunnel Diode
Display Monitors – Through the Looking Glass
Dual-Trace Time Difference Measurements with Sampling
Dynamic Graphics Gives Best of Both Stored and Refreshed Display Techniques
EMI Applications Using the Spectrum Analyzer
Easier Waveform Photography
Eight-pen Option Brings Automatic Pen Changes to the 4662 Plotter
Engine Analyzer System
Engineer V Profile: Charlie Rhodes
Enhanced Performance Transient Digitizer, the LM7912
Evaluating Digital IC Performance Using the 576 Curve Tracer
Evaluating Test Data with Computer Graphics
Expanding Your Microwave Measurement Window
FM Broadcast Measurements Using the Spectrum Analyzer
Features Comparison of Tektronix Curve Tracers Versus HP4145A Semiconductor Parameter Analyzer (Tek internal)
Firmware Production and Maintenance
Flexible Disc Measurements Simplified by Digital Delay
Floating Oscilloscope Measurements ... And Operator Protection
Floating-Point Standard Implemented in TESLA
Frequency Stabilization Techniques
Fundamentals of Spectrum Analysis
GPIB Interface Functions and Messages (1)
GPIB Interface Functions and Messages (2)
GURU Links IBM PC to GPIB Instruments ... At Low Cost
Getting Around in Tektronix Instruments
Graphing With the 4051 Graphic Computing System
Hard Copy - Big Business for Tektronix
Hazardous Material Identification
High Frequency Wafer Probing
High Speed Quantization of Voltage Signals (PhD Thesis)
High-Speed Transient Recording System
History of the Information Display Division
Human pattern recognition speeds automated testing
IEEE 488 Bus - Going Your Way?
Improved Bias Supply for Tunnel-Diode Picosecond Pulse Generators
Improvement of the Bandwidth of the Transient Digitizers in the LIDAR Thomson Scattering Diagnostic on JET
Increased Measurement Accuracy Using a 7D15 Universal Counter/Timer in any 7000 Series Oscilloscope
Information Display Concepts
Instruction Manuals, a Service Technician's Best Friend
Interactive Graphics
Interpreting Markings on Semiconductor Components
Introducing the New Generation
Introduction to 7854 Oscilloscope Measurement and Programming Techniques
Jack Murdock obituary
Linear IC Testing Comes to the Curve Tracer
MP2902 Performs a Variety of Audio Tests ... without Programming
Making Measurements with the 492
Making the Correct Semiconductor Measurements Time After Time
Measurement Concepts: Automated Testing Systems
Measurement Concepts: Biophysical Measurements
Measurement Concepts: Engine Analysis
Measurement Concepts: Probe Measurements
Measurement Concepts: Semiconductor Device Measurements
Measurement Concepts: Television Systems
Measurement Concepts: Time-Domain Reflectometry Measurements
Measurement Concepts: Transducer Measurements
Measurement Variety. An Engineering Challenge Featuring the 7854
Measurements of the Equivalent-Circuit Parameters of Tunnel Diodes
Measuring Convential Oscilloscope Noise
Measuring Distortions in the Television Signal
Measuring FETs with a Type 575
Measuring Harmonic Distortion with a Spectrum Analyzer
Measuring Jitter with a Sampling Oscilloscope
Measuring Return-Loss
Measuring the Linearity of Fast Ramps
Merging High Performance Alphanumerics and Graphics with Fast Computation
Microwave Technology at Tektronix
Modular Electronic Instrument Cabinets Lower Costs
Multiburst Testing with the 1470 (TV Products App Note No.23)
New From Tektronix, Inc. In 1967
New Portables
New and Improved Coaxial Connectors
Nickel-Cadmium Battery Rev1ew
No Loose Ends - Revised - The Tektronix Proof-of-Performance Program for CATV
Numerical Control
Opamp Bandwidth Approximations ... using the 577/178 Curve Tracer
Optimizing Mixer Performance Using the 7L12 Spectrum Analyzer
Oscilloscope Camera Concepts
Oscilloscope to Curve Tracer with One Plug-in
Overview of the Instrument Control and Data Reduction Software in the Sandia Data Acquistion System at the Nevada Test Site
P6042 DC-to-50 MHz Current Probe
P6046 DC-to-100 MHz Differential Probe and Amplifier
Packaging A Spectrum Analyzer for Performance, Maintainability and Survival
Parameter Entry Device Simplifies Plotter Set-up and Servicing
Patent Received: 4,096,455 Surface Wave Termination for Surface Wave Device
Patent Received: 4,109,182 Simultaneous Delayed Sweep Display
Patent Received: 4,135,201 Dynamic Damping for SECAM High-Frequency De-Emphasis
Patent Received: 4,146,844 Feed-Forward Amplifier
Patent Received: 4,146,846 Amplifier Havin a High Frequency Boost Network
Patent Received: 4,151,444 Voltage Switching Circuit Improves Color Display
Patent Received: 4,153,518 Thin-Film Barrier Helps Fabricate Metallized Substrates
Patent Received: 4,159,439 New CRT Display Decreases Background Luminance
Patent Received: 4,160,276 Negative Impedance Terminator Improves Aperture Corrector
Patent Received: 4,163,948 Glitch Filter for D/A Converter
Plug-on Versatility
Plugins to Reach the Limits of your Imagination
Portable Analyzer Speeds Test and Service of Microprocessor-Based System
Portable Power
Portable Precision - Redefined
Power Electronics Measurements Made Easy with TDS Oscilloscopes
Power Supply/Device Testing
Preserving Scope Bandwidth and Sensitivity
Preventing Sampling Head Overdrive and Static Damage
Programmable Calibration Generator Speeds Instrument Checkout
Progress in Semiconductor Testing
Pulse Generator or Function Generator - Making an Intelligent Choice
Pulse, Digital, and Switching Waveforms: Devices and Circuits for Their Generation and Processing
Pulsed Signal Spectrum Analysis
Pulsed-Collector High-Current Testing with the 176
Questions for guest speakers
Quick Check for Tunnel Diodes
Random Noise Measurement with the Spectrum Analyzer
Random Sampling - A New Way of Fast Pulse Display
Random Sampling Oscilloscope Time Base
Random Sampling Oscilloscope for the Observation of Mercury Switch Closure Transition Times
Reading Capacitor Codes
Reducing Risks in Designing With LSI
Reference Waveform Flat Pulse Generator
Reliability-the Continuing Challenge
Repairing pushbutton switches
Replacing Probe Tips, Bodies, and Boots
Schematic Reading and Component Familiarization
Scope Evaluation Guide & Circuit Board Instructions
Select the Right System for the Highest Return
Semiautomatic Testing with the Curve Tracer
Service Notes - Optimizing System Risetime (1S2)
Servicing 5100-Series Display Units
Servicing the 432/434 Oscilloscopes
Servicing the 465 Portable Oscilloscope
Servicing the 7000-Series Logic and Readout
Servicing the 7704 CRT Circuit
Servicing the 7704 High-Efficiency Power Supply
Servicing the 7904 high-efficiency power supply
Servicing the C12, C13, C19 and C27 Cameras
Servicing the Sweep Circuit in the 7T11 Sampling Sweep Unit
Servicing the Telequipment D67 Oscilloscope
Servicing the Trigger Circuit in the 7T11 Sampling Sweep Unit
Short Pulse Technique of Adjusting Wideband Amplifiers
Shortening the Blanking Intervals of the Tektronix 140-144-146 NTSC Generators (TV Products App Note No.22)
Signal Generation and Conditioning with a New Modular System
Silver-Bearing Solder and Silver Solder: Two Different Things
Simplify Waveform Measurements
Simultaneous X-Y, Y-T Displays Using a 5100-Series Oscilloscope
Slewed-Edge Signals Simplify Fast Sweep Timing
Software Innovations Increase Productivity of Desktop Computer Users
Soldering Tektronix Circuit Boards
Some Experiences in IC Testing
Some Thoughts from a System Builder
Specifying Product Performance
Spectrum Analysis utilizing Waveguide Mixers
Spectrum Analyzer Applications in Baseband Measurements
Spectrum Analyzer Fundamentals
Spectrum Analyzer Techniques for Frequency Stability Measurements
Spectrum analyzers require high technology
Spotlighting Hidden Pulses
Storage Display Instruments
Storage Expands Your Oscilloscope Measurement Capabilities
Strain Gage Measurement Concepts
Sweep Delay Today
System Sweep Use and Documentation
TDR Tools in Modeling Interconnects and Packages
TEK SPS BASIC – Modular Software for Instrument Control
TEKCOM: A Cyber-based Electronic Mail System
TM 5000-A New Family of IEEE-488 Programmable Instruments
TM500 Power Module Tester and Utility Power Supply
TM500 series - A New Dimension in Plug-in Instrumentation
Taking the Delay out of Delaying Sweep Measurements
Talking to the 7854 scope with TEK SPS BASIC.
TekMAP 7854 Time and Amplitude Measurement Software
TekMAP 7854/HP Series 200 software
Tektronix 4041 Plus and 4041DDU
Tektronix 7854TDR and 7854MPS measurement packages
Tektronix Curve Tracers - Device Testing Techniques
Tektronix Looks at Light
Tektronix Measurement Systems
Tektronix Products Get Dirty, Too! Part 1 - Wet washing
Tektronix Products Get Dirty, Too! Part 2 - Dry cleaning, cam switches
Tektronix R7912 Programmable Transient Waveform Digitizer
Tektronix Signal Sources
Tektronix Storage Tubes
Tektronix Type 1S2 Makes Reflectometry Easy
Tektronix and the World of Television Measurements
Tektronix oscilloscopes (IBM Customer Engineering Manual)
Testing Component Video Systems
Testing Optoisolators
Testing Three-Terminal Regulators with a Curve Tracer
Testing and Using Synchronous Demodulators
The 31/53 Calculator-based Measurement Instrumentation Package
The 4027 - Adding a Color Dimension to Graphics
The 4662 - A New Concept: Interactive Digital Plotting
The 4663 - Large Plotter Capability with Small Plotter Convenience
The 7000-Series Oscilloscopes as Signal Sources
The 7704A – Extended Performance Plus Modularity
The 7D14 Counts Current to Minimize Circuit Loading
The 8002 – A New Design Tool for Microprocessor Users
The ABCs of Probes
The Auxiliary Video Facility of the 1480-Series of Waveform Monitors (TV Products App Note No.17)
The FET takes its place
The FG504 - A New Standard in Function Generators
The Fundamental Beauty of Computer Graphics
The Logic Probe and the Oscilloscope
The Low-Frequency Oscilloscope Goes Plug-in
The New Look in Portables
The New Portables
The Oscilloscope and Transducer Measurements
The Oscilloscope with Computing Power
The Oscilloscope with the Digital Multimeter
The Oscilloscope-controlled Counter
The R1340 Data Coupler
The Simple Sampling Oscilloscope
The Spectrum Analyzer and the Earth Station
The State of the Art in Sampling
The T900 Series – Solving the Cost vs Quality Question
The TM500 Mobile Test Lab
The Tektronix 492 Is A New-Generation Spectrum Analyzer
The Tektronix Cookbook of Standard Audio Tests using the 5L4N Low Frequency Spectrum Analyzer
The Tektronix Scientist 909
The Use of the General Radio Immittance Bridge in Tunnel-Diode Measurements
The Virtual Bit Map Brings High Resolution Graphics to the Alphanumerics Terminal User
Three Kinds of Storage
Three New Portable Oscilloscopes Designed for Field Service Use
Time measurements to better than 1%
Time-Domain Reflectometry Theory and the Testing of Coaxial Transmission Lines
Transition Counting with an Oscilloscope
Transmission Line Characteristics ... A Review
Triggering the oscilloscope from logic signals
Troubeshooting the Amplifiers
Troubleshooting Digital Circuits, Part 1
Troubleshooting Digital Circuits, Part 2
Troubleshooting Phase Lock Loops
Troubleshooting Preamplifiers
Troubleshooting Sampling Systems
Troubleshooting Sampling Systems, Part 2
Troubleshooting Tektronix High-Frequency Spectrum Analyzers
Troubleshooting Your Oscilloscope
Troubleshooting a Microprocessor (Logic Analyzer App Note #57K1.0)
Troubleshooting the 453
Troubleshooting the 7B70 and 7B71 Time Bases
Troubleshooting the High-Voltage Supply
Troubleshooting the Power Supply
Troubleshooting the Sweep Ciruits
Troubleshooting the Trigger Circuits
Tunnel Diode Switching Circuits and the Back Diode
Tunnel Diode Switching Circuits and the Back Diode, Part II
Tunnel Diodes: In-Circuit Testing Using the 7D13 Digital Multimeter Plug-In
Turning Easily From One Thing to Another
Two Bright Dots on the Sampling Horizon
Two Graphics Technologies Merged
Two New Graphic Display Modules for the OEM System Designer
Two New Graphic Terminals Expand Graphic Capabilities
Two New Hard Copy Units Feature Low-Cost, High-Contrast Copies
Two Weatherproof TDR Cable Testers for Field Use
USB Spectrum Analyzers and SignalVu-PC – Frequently Asked Questions
Understanding Delaying Sweep
Understanding oscilloscope trigger controls
Unraveling the Mystery on the GPIB
Updating the Industry-Standard 100 MHz Portable Oscilloscope
Useful IC Tools
Using the 144 as a Simple Special Effects Generator
Using the 7854 in a GPIB configuration
Using the Multipulse Waveform to Measure Group Delay and Amplitude Errors
Using your oscilloscope probe (Part 1)
Using your oscilloscope probe (Part 2)
Verifying the Bruch Blanking Sequence (TV Products App Note No.16)
Versatile Analogue Chip for Oscilloscope Plug-ins
Vertical Interval Test Signals - Reprogramming Tektronix Signal Generators (TV Products App Note No.19)
Video Copiers
Viewing Fast Transitions at Slow Sweep Speeds
WP1310 Signal Processing System
WP1310 Waveform Processing System
Washing Your Tektronix Instrument
We Go Where You Go With Lab Quality Spectrum Analysis
What You Need to Know About Testing 4k MOS Memories
Wire-Wrap for Hi-Speed Logic Circuits
X-Y Displays with Interval Timing for Measuring SOA
XYZs of Oscilloscopes (Primer)
Z-Profile Algorithm
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