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Tekscope V2 N1 P2 (1) ·
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Tekscope 1970 V2 N1 Feb 1970.pdf (1) ·
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Tekscope 1970 V2 N3 Jun 1970.pdf (1) ·
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Tekscope 1972 V4 N1 Jan 1972.pdf (1) ·
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Tekscope 1973 V5 N2 Mar 1973.pdf (1) ·
Tekscope 1973 V5 N3 May 1973.pdf (1) ·
Tekscope 1973 V5 N6 Nov 1973.pdf (1)
A Dual-beam Family (1) ·
A fast A/D plug-in for the oscilloscope (1) ·
A Microwave Spectrum Analyzer for the 7000-Series Oscilloscopes (1) ·
A Nanosecond Portable Oscilloscope (1) ·
Automated Measurement Systems (1) ·
Delaying Sweep Goes Digital (1) ·
Dual-Trace Time Difference Measurements with Sampling (1) ·
Frequency Stabilization Techniques (1) ·
Hazardous Material Identification (1) ·
Measuring Jitter with a Sampling Oscilloscope (1) ·
Preserving Scope Bandwidth and Sensitivity (1) ·
Progress in Semiconductor Testing (1) ·
Semiautomatic Testing with the Curve Tracer (1) ·
Some Thoughts from a System Builder (1) ·
Tektronix Signal Sources (1) ·
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The New Look in Portables (1) ·
The Oscilloscope with Computing Power (1) ·
The Simple Sampling Oscilloscope (1) ·
Three Kinds of Storage (1) ·
TM500 series - A New Dimension in Plug-in Instrumentation (1) ·
Turning Easily From One Thing to Another (1)
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