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Documents > Year : 1966 or 1970 or 1986

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11300-Series extends the usefulness of analog scopes (1) · A Dual-beam Family (1) · Amplitude Measurement to Better Than 1% (1) · Audio analyzer system creates automatic test programs – without programming (1) · Automated Measurement Systems (1) · Basic Sampling (1) · Circuit Concepts: Sampling Oscilloscope Circuits (1) · Data Communication Basics (1) · Digital pulse-echo techniques for advanced composites (1) · Easier Waveform Photography (1) · Hazardous Material Identification (1) · Improved Bias Supply for Tunnel-Diode Picosecond Pulse Generators (1) · Interactive Graphics (1) · Measurement Concepts: Engine Analysis (1) · Measurement Concepts: Spectrum Analyzer Measurements (1) · Measurement Concepts: Transducer Measurements (1) · Measuring Jitter with a Sampling Oscilloscope (1) · Servicing the C12, C13, C19 and C27 Cameras (1) · Some Experiences in IC Testing (1) · Some Thoughts from a System Builder (1) · Specifying Product Performance (1) · Strain Gage Measurement Concepts (1) · TekMAP 7854/HP Series 200 software (1) · Tektronix 4041 Plus and 4041DDU (1) · Tektronix Signal Sources (1) · Tektronix Storage Tubes (1) · Tektronix Type 1S2 Makes Reflectometry Easy (1) · The 7000-Series Oscilloscopes as Signal Sources (1) · The ABCs of Probes (1) · Time measurements to better than 1% (1) · Troubleshooting Preamplifiers (1) · Troubleshooting Sampling Systems (1) · Troubleshooting Sampling Systems, Part 2 (1) · Troubleshooting the 453 (1) · Tunnel Diode Switching Circuits and the Back Diode (1) · Tunnel Diode Switching Circuits and the Back Diode, Part II (1) · Turning Easily From One Thing to Another (1) · Useful IC Tools (1)
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None (5) · Tunnel diodes (5) · Sampling (3) · 2901 (2) · 7503 (2) · C-70 (2) · T4002 (2) · Transducers (2)

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