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Application Note (14) · Article (6) · Brochure (2)

None (17) · 10 (2) · 11 (2) · 12 (2) · 13 (2) · 14 (1) · 15 (1) · 16 (1) · 2 (1) · 3 (4) · 5 (1) · 6 (2) · 7 (3) · 9 (1)

4050 Controls New Generation of Programmable Instruments for Measurement Automation (1) · 4050 Users Share Data Storage and Retrieval in New Tektronix Hard Disk (1) · 4050E01 Offers Backpack Expansion (1) · 4052 GPIB Programming Guide Now Available (1) · 4052 Helps Interpret Seismic Waveforms (1) · 7854 Application Programs (1) · 7854 Waveform Calculator Keyboard Guide (1) · A Fast Unidirectional TTY Interface for a Minicomputer (1) · A High Resolution Color Picture Monitor for Television and Laboratory Use (1) · A Microprocessor Development Lab with an Expandable Future (1) · A Multiple-User Software Development Unit (1) · A Powerful New Tool for Integrating Microcomputer Hardware and Software (1) · A Real-Time Debugging Tool for the 8500 Series MDL (1) · Advanced Triggering Techniques (1) · Codes and Formats Standard Adds Compatibility and Capability to IEEE-488 Instruments (1) · Configurable State-of-the Art Logic Analyzer Gives Choice of Performance (1) · Designing a New Price/Performance Standard for Portable Oscilloscopes (1) · Eight-pen Option Brings Automatic Pen Changes to the 4662 Plotter (1) · Features Comparison of Tektronix Curve Tracers Versus HP4145A Semiconductor Parameter Analyzer (Tek internal) (1) · Floating Oscilloscope Measurements ... And Operator Protection (1) · FM Broadcast Measurements Using the Spectrum Analyzer (1) · Increased Measurement Accuracy Using a 7D15 Universal Counter/Timer in any 7000 Series Oscilloscope (1) · Introduction to 7854 Oscilloscope Measurement and Programming Techniques (1) · Making the Correct Semiconductor Measurements Time After Time (1) · Measurement Variety. An Engineering Challenge Featuring the 7854 (1) · New Products (2) · No Loose Ends - Revised - The Tektronix Proof-of-Performance Program for CATV (1) · Power Electronics Measurements Made Easy with TDS Oscilloscopes (1) · Power Supply/Device Testing (1) · Programmable Calibration Generator Speeds Instrument Checkout (1) · Slewed-Edge Signals Simplify Fast Sweep Timing (1) · Software Innovations Increase Productivity of Desktop Computer Users (1) · System Sweep Use and Documentation (1) · Three New Portable Oscilloscopes Designed for Field Service Use (1) · TM 5000-A New Family of IEEE-488 Programmable Instruments (1) · Two New Graphic Terminals Expand Graphic Capabilities (1) · Two New Hard Copy Units Feature Low-Cost, High-Contrast Copies (1) · Using the 7854 in a GPIB configuration (1) · Using the Multipulse Waveform to Measure Group Delay and Amplitude Errors (1)

None (15) · Ben M. Williams (1) · Bill Allen (1) · Bob Cram (1) · Bob Hunter (1) · Bob Metzler (1) · Bob Oswald (1) · Bruce Rodgers (1) · Cathy Cramer (1) · Chuck Smith (2) · Clark Foley (1) · Clifford B. Schrock (1) · Craig Montgomery (1) · Dale Aufrecht (1) · Dave Squire (1) · Dave Watts (1) · Dean Bailey (1) · Gary Kirchberger (1) · Jack Sterett (1) · James E. Gaiser (1) · Jerry Shannon (1) · Joe Hallett (1) · John Horn (1) · John Huber (1) · Laurie Lawrence (1) · Mark Mehall (1) · Mike Mraz (1) · Patricia Kelley (1) · Peter Zietzke (1) · R. Christie Harper (1) · Roger Ensrud (1) · Roger Loop (1) · Tom Peekema (1) · William G. Bevan (1)

7854 (6) · 4051 (3) · 4052 (3)

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