Drilldown: Patents

Jump to navigation Jump to search
Patents > Company : Automated Measurements Corp or Tektronix Inc & Grant date: 2000 - 2009

Use the filters below to narrow your results.

Inventors:
Linley Gumm (14) · Bozidar Janko (11) · Xiaofen Chen (4) · Dan Knierim (3) · Steven D. Maurer (3) · Kamalesh Patel (2) · Kevin J. Ilcisin (2) · Les Larson (2) · Phil Crosby (2) · Thomas L. Kuntz (2) · Thomas S. Buzak (2) · William R. Mark (2)
Company: (Click arrow to add another value)
Filing date:
1997 (1) · 1998 (8) · 1999 (7) · 2000 (5) · 2001 (10) · 2002 (2) · 2003 (5) · 2004 (1)
Grant date:
2000 (2) · 2001 (7) · 2002 (9) · 2003 (7) · 2004 (6) · 2005 (5) · 2006 (1) · 2008 (1) · 2009 (1)
Cites:
None (38) · Patent US 4647862A (1) · Patent US 4704691A (1) · Patent US 4743844A (1) · Patent US 4980605A (1) · Patent US 5027058A (1) · Patent US 5172229A (1) · Patent US 5268851A (1) · Patent US 5347540A (1) · Patent US 5471159A (1) · Patent US 5530454A (1) · Patent US 5841286A (1)
Links:
None (38) · Time domain reflectometers (1)

Showing below up to 39 results in range #1 to #39.

View (previous 250 | next 250) (20 | 50 | 100 | 250 | 500)


View (previous 250 | next 250) (20 | 50 | 100 | 250 | 500)

Retrieved from "https://w140.com/tekwiki/wiki/Special:Drilldown/Patents"