Application Notes: Difference between revisions
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* [[Media:AX-3535.pdf|AX-3535: M. Engelson, ''Crystal Device Measurements Using the Spectrum Analyzer'']], 1977 (PDF) | * [[Media:AX-3535.pdf|AX-3535: M. Engelson, ''Crystal Device Measurements Using the Spectrum Analyzer'']], 1977 (PDF) | ||
* [[Media:Floating Oscilloscope Measurements 1981.pdf|''Floating Oscilloscope Measurements ... And Operator Protection'']], 1981 (PDF) ''(→ [[A6902]])'' | * [[Media:Floating Oscilloscope Measurements 1981.pdf|''Floating Oscilloscope Measurements ... And Operator Protection'']], 1981 (PDF) ''(→ [[A6902]])'' | ||
* [[Media:42W-5334.pdf|42W-5334: ''Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In'']], 1983 (PDF, OCR) ''(→ [[7854]] [[7S12]])'' | |||
* [[Media:42W-6694.pdf|42W-6694: ''High Frequency Wafer Probing'']], 1987 (PDF, OCR) ''(→ [[7854]])'' | * [[Media:42W-6694.pdf|42W-6694: ''High Frequency Wafer Probing'']], 1987 (PDF, OCR) ''(→ [[7854]])'' | ||
* [[Media:85W-8885-0.pdf|85W-8885-0: ''TDR Tools in Modeling Interconnects and Packages'']], 1993 (PDF, OCR) | * [[Media:85W-8885-0.pdf|85W-8885-0: ''TDR Tools in Modeling Interconnects and Packages'']], 1993 (PDF, OCR) |