Patent US 6246717B1

Patent number	US 6246717B1 (click link for details and documents via Google Patents)
Title	Measurement test set and method for in-service measurements of phase noise
Inventors	Xiaofen Chen, Linley Gumm, Dana E. Whitlow, Larry Lockwood
Company	Tektronix Inc
Filing date	1998-11-03
Grant date	2001-06-12