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* [[Media:AX-3535.pdf|AX- | * [[Media:AX-3079.pdf|AX-3079: Television Products App Note no. 17, ''The Auxiliary Video Facility of the 1480-Series of Waveform Monitors'']], 1974 (PDF) ''(→ [[1480]])'' | ||
* [[Media:AX-3535.pdf|AX-3535: M. Engelson, ''Crystal Device Measurements Using the Spectrum Analyzer'']], 1977 (PDF) | |||
* [[Media:Floating Oscilloscope Measurements 1981.pdf|''Floating Oscilloscope Measurements ... And Operator Protection'']], 1981 (PDF) ''(→ [[A6902]])'' | * [[Media:Floating Oscilloscope Measurements 1981.pdf|''Floating Oscilloscope Measurements ... And Operator Protection'']], 1981 (PDF) ''(→ [[A6902]])'' | ||
* [[Media:42W-6694.pdf|42W-6694: ''High Frequency Wafer Probing'']], 1987 (PDF, OCR) ''(→ [[7854]])'' | * [[Media:42W-6694.pdf|42W-6694: ''High Frequency Wafer Probing'']], 1987 (PDF, OCR) ''(→ [[7854]])'' |
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