Patent US 3134077A
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| Patent number | US 3134077A (click link for details and documents via Google Patents) |
|---|---|
| Title | Electrical probe apparatus for measuring the characteristics of semiconductor material |
| Inventors | Thomas B Hutchins IV, William C Myers, Jean F DeLord |
| Company | Tektronix Inc |
| Filing date | 1961-09-18 |
| Grant date | 1964-05-19 |