Patent US 6246717B1
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| Patent number | US 6246717B1 |
|---|---|
| Title | Measurement test set and method for in-service measurements of phase noise |
| Inventors | Xiaofen Chen, Linley Gumm, Dana E. Whitlow, Larry Lockwood |
| Company | Tektronix Inc |
| Filing date | 1998-11-03 |
| Grant date | 2001-06-12 |
| Cites |