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567: Difference between revisions
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based on waveform characteristics. This feature makes the 567 particularly useful in | based on waveform characteristics. This feature makes the 567 particularly useful in | ||
production testing for tasks such as binning logic gates based on their speed. | production testing for tasks such as binning logic gates based on their speed. | ||
The development of the 567 (and 6R1) was led by [[Sam McCutcheon]]. | |||
The 567 came after the [[661]] and before the [[568]] and its associated [[230]] Digital Unit. | The 567 came after the [[661]] and before the [[568]] and its associated [[230]] Digital Unit. | ||