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Distributed deflection plates: Difference between revisions
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Distributed deflection plates (view source)
Revision as of 19:33, 12 December 2023
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[[File:Distributed deflection plates.jpg|300px|thumb|right|Distributed vertical deflection plates and delay lines in a [[T581]] CRT (beam direction left to right)]] | [[File:Distributed deflection plates.jpg|300px|thumb|right|Distributed vertical deflection plates and delay lines in a [[T581]] CRT (beam direction left to right)]] | ||
[[File:Distributed deflection schematic.jpg|thumb|300px|right|Simplified schematic of distributed deflection structure]] | [[File:Distributed deflection schematic.jpg|thumb|300px|right|Simplified schematic of distributed deflection structure]] | ||
In [[CRT]]s, a trade/off exists between writing rate, deflection sensitivity and spot size. Within a given technology (e.g. mono acceleration, post deflection acceleration or microchannel plate | In [[CRT]]s, a trade/off exists between writing rate, deflection sensitivity and spot size. Within a given technology (e.g. mono acceleration, post deflection acceleration or microchannel plate (MCP)), these three characteristics can be traded off against each other. Improve one and the others suffer. Improve the technology and all three can be improved simultaneously. Writing rate is important for observing single short-lived events, but is not important for repetitive signals. Spot size is important in showing detail in the waveform. Sensitivity is important mostly to permit greater bandwidth in vertical amplifiers. | ||
Meshes that shield the deflection plates from the strength of post electron acceleration field and electron lenses both trade off sensitivity against spot size to varying degrees. They do, however, contribute net performance improvements. | Meshes that shield the deflection plates from the strength of post electron acceleration field and electron lenses both trade off sensitivity against spot size to varying degrees. They do, however, contribute net performance improvements. | ||
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* [[Media:062-0852-01.pdf | Oscilloscope Cathode-Ray Tube Concepts]], Chuck Devere, 1969 | * [[Media:062-0852-01.pdf | Oscilloscope Cathode-Ray Tube Concepts]], Chuck Devere, 1969 | ||
* [[John Addis]], ''Good Engineering and Fast Vertical Amplifiers'', in Jim Williams (Ed.), ''Analog Circuit Design: Art, Science and Personalities'' (1991), p.115+ | * [[John Addis]], ''Good Engineering and Fast Vertical Amplifiers'', in Jim Williams (Ed.), ''Analog Circuit Design: Art, Science and Personalities'' (1991), p.115+ | ||
* [[Aris Silzars, Richard Knight]], "The Deflection Sensitivity of Traveling-Wave Electron -Beam Deflection Structures" (Nov 1972) IEEE Transactions on Electron Devices | |||
<gallery> | <gallery> | ||