7D01: Difference between revisions

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When combined with an optional [[DF1]] or [[DF2]] display formatter (attached to the left of the 7D01 through a [[D-sub connector|DD-50 connector]]), data domain displays (state table and map) become available, and the formatter generates the readout in timing diagram mode, allowing a 7D01 with display formatter to be used in mainframes without readout, e.g. the large-screen [[7603N]].
When combined with an optional [[DF1]] or [[DF2]] display formatter (attached to the left of the 7D01 through a [[D-sub connector|DD-50 connector]]), data domain displays (state table and map) become available, and the formatter generates the readout in timing diagram mode, allowing a 7D01 with display formatter to be used in mainframes without readout, e.g. the large-screen [[7603N]].
The 9<sup>th</sup> channel on the first probe serves as an external clock input, that on the second probe as an external qualifier.
The input logic threshold can be set to 1.4 V for TTL, a screwdriver-adjustable voltage (VAR) between −12 V and +12 V, or a mixed mode (TTL-VAR) where the first probe (0–7, CLK) is set to the variable voltage, and the second probe (9−15, QUAL) to 1.4 V.
The 7D01 acquires data asynchronously using an internal clock from 10 ns to 50 ms per sample, or synchronously based on an external clock.
A built-in word recognizer can trigger on any combination of the 16 data signals, plus the probe and external qualifier inputs. 
The recognizer's output is available to trigger an external unit, e.g. when the 7D01 is combined with amplifier and timebase plug-ins in a 4-bay mainframe.
There is no internal glitch detector, but a separate [[DL2]] or [[DL502]] latch plug-in can be used to stretch short pulses ≥5 ns to the clock period.
The latch plugs in between the P6451 probes and the 7D01's inputs, and receives the sample clock from the 7D01's Store Clock output.


Project manager for the 7D01 was [[Murlan Kaufman]].  Project leader was [[Keith Taylor]], with [[Morris Green]] and [[Jeff Bradford]] doing electrical design, and [[Ed Wolf]] mechanical design. [[Wendell Damm]] worked on the active probe.
Project manager for the 7D01 was [[Murlan Kaufman]].  Project leader was [[Keith Taylor]], with [[Morris Green]] and [[Jeff Bradford]] doing electrical design, and [[Ed Wolf]] mechanical design. [[Wendell Damm]] worked on the active probe.
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{{EndSpecs}}
{{EndSpecs}}
==Acquisition==
The 7D01 acquires data asynchronously using an internal clock from 10 ns to 50 ms per sample, or synchronously based on an external clock.
The 9<sup>th</sup> channel on the first probe serves as an external clock input, that on the second probe as an external qualifier.
A built-in word recognizer can trigger on any combination of the 16 data signals, plus the probe and external qualifier inputs. 
The recognizer's output is available to trigger an external unit, e.g. when the 7D01 is combined with amplifier and timebase plug-ins in a 4-bay mainframe.
The input logic threshold can be set to 1.4 V for TTL, a screwdriver-adjustable voltage (VAR) between −12 V and +12 V, or a mixed mode (TTL-VAR) where the first probe (0–7, CLK) is set to the variable voltage, and the second probe (9−15, QUAL) to 1.4 V.
There is no internal glitch detector, but a separate [[DL2]] or [[DL502]] latch plug-in can be used to stretch short pulses ≥5 ns to the clock period.
The latch plugs in between the P6451 probes and the 7D01's inputs, and receives the sample clock from the 7D01's Store Clock output.


==Internals==
==Internals==

Revision as of 08:32, 23 September 2023

Tektronix 7D01
16-ch Logic Analyzer
Tektronix 7D01 without display formatter

Compatible with 7000-series scopes

Produced from 1976 to 1985

Manuals
Manuals – Specifications – Links – Pictures

The Tektronix 7D01 is a 16-channel logic analyzer plug-in for the 7000-series scopes that takes two P6451 8+1 channel probes.

When used by itself, it only displays a timing diagram that can be positioned and zoomed using analog controls, and uses the mainframe's readout system to indicate the cursor position (on top) and the binary data pattern at the cursor location (using the two bottom readout fields).

When combined with an optional DF1 or DF2 display formatter (attached to the left of the 7D01 through a DD-50 connector), data domain displays (state table and map) become available, and the formatter generates the readout in timing diagram mode, allowing a 7D01 with display formatter to be used in mainframes without readout, e.g. the large-screen 7603N.

Project manager for the 7D01 was Murlan Kaufman. Project leader was Keith Taylor, with Morris Green and Jeff Bradford doing electrical design, and Ed Wolf mechanical design. Wendell Damm worked on the active probe.

Key Specifications

Channels
  • 4 channels at 1016 bits/channel, maximum external clock period 10 ns (100 MHz)
  • 8 channels at 508 bits/channel, maximum external clock period 20 ns (50 MHz)
  • 16 channels at 254 bits/channel, maximum external clock period 40 ns (25 MHz)
Sampling Rate 10 ns to 5 ms per sample (1–2–5) or external clock up to 50 MHz
Trigger Sources
  • external
  • channel 0 data
  • 16 channel word recognizer
  • manual

Acquisition

The 7D01 acquires data asynchronously using an internal clock from 10 ns to 50 ms per sample, or synchronously based on an external clock. The 9th channel on the first probe serves as an external clock input, that on the second probe as an external qualifier.

A built-in word recognizer can trigger on any combination of the 16 data signals, plus the probe and external qualifier inputs. The recognizer's output is available to trigger an external unit, e.g. when the 7D01 is combined with amplifier and timebase plug-ins in a 4-bay mainframe.

The input logic threshold can be set to 1.4 V for TTL, a screwdriver-adjustable voltage (VAR) between −12 V and +12 V, or a mixed mode (TTL-VAR) where the first probe (0–7, CLK) is set to the variable voltage, and the second probe (9−15, QUAL) to 1.4 V.

There is no internal glitch detector, but a separate DL2 or DL502 latch plug-in can be used to stretch short pulses ≥5 ns to the clock period. The latch plugs in between the P6451 probes and the 7D01's inputs, and receives the sample clock from the 7D01's Store Clock output.

Internals

The 7D01 does not contain a microprocessor and is built entirely from off-the-shelf ECL and TTL logic ICs. The data path, acquisition memory, and clock generator in the 7D01 are built using ECL circuits.

The –4.8 V and –2 V ECL supplies are generated by a 555-driven switcher powered off the ±15 V rails.

There is an internal DB-25 data output connector and a front-panel cut-out for the corresponding cable. (Any known uses?)

Notes

Note about external clock rates (from Jim Mauck):

When I was a Tek Service Technician I worked on the 7D01. For several years I tested every 7D01 I worked on (and that was a lot of them) with a 100 MHz external clock in 16 channel mode. I would use a DF2 and set it to reacquire continuously as long as the 7D01 memory was the same as the original data I stored into the DF2 memory. The analyzer would run for hours without error. The funny part is that it wasn't until I had been doing this for several years that I realized it wasn't specified to run at that frequency. I continued to test them that way even after I discovered my error. However the instrument exceeding the specifications might be due to the data source providing a generous setup and hold time relative to the active clock edge.

The 7D01 is often affected by bad TI IC sockets, see the Repairs tab.

Links

Pictures

Components

Some Parts Used in the 7D01

Part Part Number(s) Class Description Used in
155-0090-00 155-0090-00 155-0090-01 155-0090-02 Monolithic integrated circuit four-decade counter, latch and D/A converter 7B85 7D01 7D12 7D15 7J20
155-0171-00 155-0171-00 Monolithic integrated circuit four-decade counter, latch and D/A converter 7B85 7D01 7D12 7D15 7J20