1 row is stored for this page
| Field | Field type | Value |
|---|
| _creationDate | Datetime | 2024-10-14 10:32:29 AM |
| _modificationDate | Datetime | 2024-10-14 12:46:15 PM |
| _categories | List of String, delimiter: | | |
| _isRedirect | Boolean | No |
| _pageID | Integer | 36,946 |
| _pageName | Page | Patent US 3976864A |
| _pageTitle | String | Patent US 3976864A
|
| _pageNamespace | Integer | 0 |
1 row is stored for this page
| Field | Field type | Value |
|---|
| Office | String | US |
| Number | String | 3976864A |
| Title | String | Apparatus and method for testing digital circuits |
| Inventors | List of Page, delimiter: ; | Gary B. Gordon • George A. Haag • Jan R. Hofland • Daniel I. Kolody |
| Company | List of Page, delimiter: ; | Hewlett-Packard |
| Filing_date | Date | 1974-09-03 |
| Grant_date | Date | 1976-08-24 |
| Cites | List of Page, delimiter: ; | Patent US 3582633A • Patent US 3651315A • Patent US 3739160A • Patent US 3777129A • Patent US 3780277A • Patent US 3812426A • Patent US 3813647A • Patent US 3821645A • Patent US 3826909A • Patent US 3832535A |
| Links | List of Page, delimiter: ; | Signature analysis • 308 • SA501 |