308

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Sony/Tektronix 308
20 MHz 8-ch Logic Analyzer
Sony/Tektronix 308

Produced from 1980 to 1986

Manuals
ROM/PLD Images
File Pos. Checksum
160-0768-00.bin U430 7141b129
160-0769-00.bin U432 676d083a
160-0770-00.bin U434 0f72eb07
160-0797-00.bin U486 (char gen) fd426d5f

(Manuals are OCRed PDF files unless noted otherwise)

Manuals – Specifications – Links – Pictures

The Sony/Tektronix 308 is a portable 8-channel, 20 MHz "data analyzer" (logic analyzer) with parallel timing, parallel state, serial (up to 9600 bps) and signature analysis modes.

The 308 uses three probes, the standard P6451 8-channel + clock data acquisition probe, the optional 16-channel P6406 word recognizer probe (both of these use 012-0747-00 cable harnesses to attach to the data source), and the P6107 ×10 probe for serial or signature analysis.

Key Specifications

     — Inputs
Data Eight data channels + 1 clock channel (P6451 probe), impedance 1 MΩ // 5 pF, max. ±40 V nondestructive, logic threshold fixed 1.4 V (TTL) or variable from −12 V to +12 V
Word recognizer Sixteen TTL inputs (+40/−400 μA max.), max. +15/−1 V
Serial BNC connector, 1 MΩ // 40 pF, max. ±250 V on BNC; used with P6107 probe, 10 MΩ // 13 pF, max. ±500 V
Qualifier BNC connector, 10 kΩ, max. +10/−5 V
     — Acquisition
Clock 50 ns to 200 ms per sample (1-2-5 sequence) or external down to 50 ns
Timing Data setup time min. 25 ns, hold time min. 0 ns
Memory 2 × 252 eight-bit words (acquisition + reference)
Trigger mode PRE (trigger at memory location 240) or POST (location 13)
Trigger delay 0-65535 clock periods
Serial data 5, 6, 7 or 8 bits per character, asynchronous (50, 75, 110, 134.5, 150, 200, 300, 600, 1200, 1900, 2400, 4800 or 9600 bits/s or external up to 9600 bits/s) or synchronous up to 9600 bits/s
Signature analysis 20 MHz via serial probe input (data) and P6451 (0 start, 1 stop, C clock); up to 8 recent signatures displayed
     — Display
CRT 154-0814-00, 6.8 cm × 5.4 cm, P4 phosphor (white)
     — General
Power 90-132 V or 180-250 V, 48-440 Hz
Weight 3.7 kg (8.16 lb)

Links

Documents Referencing 308

Document Class Title Authors Year Links
Tekscope 1980 V12 N1.pdf Article New Products 1980
Tekscope 1980 V12 N2.pdf Article Portable Analyzer Speeds Test and Service of Microprocessor-Based System Ed Averill John Huber 1980

Patents that may apply to 308

Page Title Inventors Filing date Grant date Links
Patent US 3976864A Apparatus and method for testing digital circuits Gary B. Gordon George A. Haag Jan R. Hofland Daniel I. Kolody 1974-09-03 1976-08-24

Internals

The 308 is built around an Intel 8085A microprocessor. The display is a magnetically deflected raster-scan CRT. The only Tek-specific IC in the 308 is a 155-0067-02 SMPS controller.

Pictures

Internals

Probes

Operation

Components

Some Parts Used in the 308

Part Part Number(s) Class Description Used in
151-0232-00 151-0232-00 Discrete component dual NPN transistor 067-0596-00 067-0679-00 067-0690-00 067-0690-01 067-0886-01 067-0886-02 067-0886-03 067-0886-04 067-0886-05 1S2 11B2A 1101 1350 140 1401 1401A 141 141A 142 1420 1421 1422 144 145 1450 146 147 147A 1470 1478 148 148M 1480C 1481C 1482C 1485C 149 149A 176 221 26A1 26G1 26G2 2620 285 3A10 3T2 308 323 324 326 4115B 432 434 4501 4601 4602 4610 4620 4623 4631 4632 4633A 4634 464 465 465B 466 468 4701 492 492A 492AP 492P 494 494P 496 496P 502A RM502A 5030 R5030 5031 R5031 5403 5440 5443 5444 576 5A13N 5A26 5L4N 630 647A R647A 650 650A 650HR 651 651A 651HR 652 652A 652HR 653A 653HR 654 655 655A 655HR 656A 656HR 670 670A 671 671A 690SR R7103 7104 7313 7403N R7403N 7503 7504 7514 7603 7612D 7613 7623 7623A 7633 7704 R7704 7704A 7834 7844 R7844 7854 7903 R7903 7904 7904A 7912AD R7912 7934 7A19 7B51 7B70 7B71 7D13A 7D20 7L12 851 8560 8561 AM501 CG5001 CG551AP DM501A DM502A DM505 FG501 FG503 FG504 FG507 GMA304 M M3 OF150 OF151 OF152 OF235 RG501 SPG1 SPG2 S-51 TSG4
154-0814-00 154-0814-00 CRT CRT 308
154-0848-00 154-0848-00 CRT CRT 308
155-0067-02 155-0067-00 155-0067-02 155-0067-03 Monolithic integrated circuit SMPS controller 308 434 485 690 7104 7704A 7834 7844 7854 7904 7904A 7912AD 7912HB 7934 P7001 R7103 R7903 R7912
2316E Monolithic integrated circuit 2K×8 ROM 308
2364 Monolithic integrated circuit 8K×8 ROM 308
Intel 8085A 156-1088-00 156-1088-02 Monolithic integrated circuit 8-bit microprocessor 308 468 4025 5D10 7A42 7D02 AFG5101 AFG5102 PFG5105


Patents that may apply to 308

Page Title Inventors Filing date Grant date Links
Patent US 3976864A Apparatus and method for testing digital circuits Gary B. Gordon George A. Haag Jan R. Hofland Daniel I. Kolody 1974-09-03 1976-08-24