1 row is stored for this page
| Field | Field type | Value |
|---|
| _creationDate | Datetime | 2021-08-31 11:30:39 AM |
| _modificationDate | Datetime | 2022-12-13 1:17:15 PM |
| _categories | List of String, delimiter: | | Patents |
| _isRedirect | Boolean | No |
| _pageID | Integer | 28,684 |
| _pageName | Page | Patent US 8436624B2 |
| _pageTitle | String | Patent US 8436624B2
|
| _pageNamespace | Integer | 0 |
1 row is stored for this page
| Field | Field type | Value |
|---|
| Office | String | US |
| Number | String | 8436624B2 |
| Title | String | Signal acquisition system having reduced probe loading of a device under test |
| Inventors | List of Page, delimiter: ; | Josiah A. Bartlett • Ira G. Pollock • Dan Knierim • Les Larson • Scott R. Jansen • Kenneth P. Dobyns • Michael Duane Stevens |
| Company | List of Page, delimiter: ; | Tektronix Inc |
| Filing_date | Date | 2010-07-29 |
| Grant_date | Date | 2013-05-07 |
| Cites | List of Page, delimiter: ; | |
| Links | List of Page, delimiter: ; | |