Ira Pollock

Ira G. Pollock (? – ?)

He won the Howard Vollum Award in 2015.

   Please add referenced biography.

Documents Authored by Ira Pollock

Document	Page	Class	Title	Author(s)	Year	Refers to
Tekscope 1976 V8 N2.pdf	12	Article	The FG504 - A New Standard in Function Generators	Ira Pollock	1976	FG504

Patents by Ira G. Pollock

Page	Title	Inventors	Assignee	Filed	Granted	Links
Patent US 4641048A	Digital integrated circuit propagation delay time controller	Ira G. Pollock	Tektronix Inc	1984-08-24	1987-02-03
Patent US 4739194A	Supergate for high speed transmission of signals	Dennis E. Glasby • Ira G. Pollock • Gale F. Hall	Tektronix Inc	1986-11-25	1988-04-19
Patent US 4740746A	Controlled impedance microcircuit probe	Ira G. Pollock • Jon C. Manor	Tektronix Inc	1987-02-24	1988-04-26
Patent US 4860291A	Test vector definition system employing template concept	Wendell W. Damm • Keith Taylor • Ira G. Pollock • Pedro Max Janowitz	Tektronix Inc	1987-12-28	1989-08-22
Patent US 4839841A	Programmable digital multiple event generator	Michael S. Hagen • Keith Taylor • Ira G. Pollock	Tektronix Inc	1988-02-01	1989-06-13
Patent US 2011074441	Low Capacitance Signal Acquisition System	Josiah A. Bartlett • Ira G. Pollock • Dan Knierim • Les Larson • Scott R. Jansen • Kenneth P. Dobyns • Michael Duane Stevens	Tektronix Inc	2009-09-30
Patent US 2011074389	Signal Acquisition System Having Probe Cable Termination in a Signal Processing Instrument	Dan Knierim • Josiah A. Bartlett • Ira G. Pollock • Les Larson	Tektronix Inc	2010-07-29
Patent US 2011074391	Signal Acquisition System Having a Compensation Digital Filter	Josiah A. Bartlett • Ira G. Pollock • Dan Knierim • Les Larson • Scott R. Jansen • Kenneth P. Dobyns • Michael Duane Stevens	Tektronix Inc	2010-07-29
Patent US 2011074392	Signal Acquisition System Having Reduced Probe Loading of a Device Under Test	Josiah A. Bartlett • Ira G. Pollock • Dan Knierim • Les Larson • Scott R. Jansen • Kenneth P. Dobyns • Michael Duane Stevens	Tektronix Inc	2010-07-29
Patent US 8436624B2	Signal acquisition system having reduced probe loading of a device under test	Josiah A. Bartlett • Ira G. Pollock • Dan Knierim • Les Larson • Scott R. Jansen • Kenneth P. Dobyns • Michael Duane Stevens	Tektronix Inc	2010-07-29	2013-05-07
Patent US 2014103951	Automatic probe ground connection checking techniques	Dan Knierim • William A. Hagerup • Barton T. Hickman • Ira G. Pollock	Tektronix Inc	2012-10-11