Patent US 4733174A: Difference between revisions
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|Number=4733174A | |Number=4733174A | ||
|Title=Circuit testing method and apparatus | |Title=Circuit testing method and apparatus | ||
|Company= | |Company=Tektronix Inc | ||
|Inventors=Phil Crosby | |Inventors=Phil Crosby | ||
|Filing date=1986-03-10 | |Filing date=1986-03-10 | ||
|Grant date=1988-03-22 | |Grant date=1988-03-22 | ||
}} | }} | ||
Latest revision as of 09:08, 31 August 2021
| Patent number | US 4733174A (click link for details and documents via Google Patents) |
|---|---|
| Title | Circuit testing method and apparatus |
| Inventors | Phil Crosby |
| Company | Tektronix Inc |
| Filing date | 1986-03-10 |
| Grant date | 1988-03-22 |