Patent US 4752928A: Difference between revisions
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|Grant date=1988-06-21 | |Grant date=1988-06-21 | ||
|Cites=Patent US 3976864A;Patent US 4096471A;Patent US 4228496A;Patent JP S5674760A;Patent GB 2070779A;Patent US 4471427A;Patent US 4480315A;Patent US 4500993A;Patent US 4554630A;Patent US 4593391A;Patent US 4603322A;Patent US 4611281A;Patent US 4660198A; | |Cites=Patent US 3976864A;Patent US 4096471A;Patent US 4228496A;Patent JP S5674760A;Patent GB 2070779A;Patent US 4471427A;Patent US 4480315A;Patent US 4500993A;Patent US 4554630A;Patent US 4593391A;Patent US 4603322A;Patent US 4611281A;Patent US 4660198A; | ||
|Links=Signature analysis | |||
}} | }} | ||
Latest revision as of 04:07, 14 October 2024
| Patent number | US 4752928A (click link for details and documents via Google Patents) |
|---|---|
| Title | Transaction analyzer |
| Inventors | David D. Chapman, Donald C. Kirkpatrick |
| Company | Tektronix Inc |
| Filing date | 1985-05-06 |
| Grant date | 1988-06-21 |
Cites:
| Patent | Title | Inventors | Assignee | Granted |
|---|---|---|---|---|
| Patent US 3976864A | Apparatus and method for testing digital circuits | Gary B. Gordon • George A. Haag • Jan R. Hofland • Daniel I. Kolody | Hewlett-Packard | 1976-08-24 |