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7L5: Difference between revisions
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* [[L1-GC]] | * [[L1-GC]] | ||
{{Documents|Link=7L5}} | {{Documents|Link=7L5}} | ||
In [[Media:TekWeek (partial) October 10, 1975.pdf|TekWeek 10 Oct 1975]], [[Thor Hallen]] says | |||
<blockquote> | |||
''What is the Communications division doing to improve the reliability and field failure rates of high technology instruments such as the 7L5, 7L12 and 7L13 spectrumanalyzers?'' | |||
Glad you asked! High technology instruments such as the spectrum analyzers you mentioned pose enormous problems in maintaining Tektronix standards for high reliability. | |||
Let’s consider the 7L5 for example. The 7L5 is the newest and most dense analyzer to date. It has approximately 2200 electrical parts packed into a two wide plug-in. | |||
(The 7L12 and 7L13 are slightly less dense.) With such a high parts population, a 0.5%/year failure rate for individual parts would be disastrous. | |||
In order to deliver better reliability, extraordinary steps are being implemented within the manufacturing area. | |||
All benches have been covered with “pink poly” to make a static-free environment for the sensitive Metal Oxide Semiconductor (MOS) circuits of the 7L5. | |||
Assemblers and technicians are being trained in static handling of these devices. | |||
The most embarrassing reliability problem that can occur is when the customer has an instrument failure within the first few hours of operation. | |||
To prevent this, the 7L5 goes through an extensive 7 day cycled burn-in. Each day the instrument is checked for electrical performance. | |||
Any failures are repaired and the burn-in is continued until the instrument has completed the 7 days. | |||
Any failures in the last two days will cause the burn-in to continue until the instrument displays two consecutive days without a failure. | |||
Along with burn-in and special handling, extensive effort is given to analysis of field and plant failures for reliability problems. | |||
In answer to your question, we have only discussed the 7L5, but the [[7L12]] and [[7L13]] receive similar treatment. | |||
There is no final solution to improved reliability. As instruments increase in complexity and reliability, challenge increases proportionately. | |||
</blockquote> | |||
==Prices== | ==Prices== | ||