Application Notes: Difference between revisions
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(Added TEK 7854 Application Note: High Frequency Wafer Probing) |
(Added link to "Crystal Device Measurements Using the Spectrum Analyzer" app note.) |
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* [[Media:7000 Series Digital Plug-In Applications.pdf|7000 Series Digital Plug-In Applications (PDF)]] | * [[Media:7000 Series Digital Plug-In Applications.pdf|7000 Series Digital Plug-In Applications (PDF)]] | ||
* [[Media:AX-3535.pdf|Crystal Device Measurements Using the Spectrum Analyzer (PDF)]] | |||
* [[Media:Floating Oscilloscope Measurements 1981.pdf|Floating Oscilloscope Measurements 1981 (PDF)]] | * [[Media:Floating Oscilloscope Measurements 1981.pdf|Floating Oscilloscope Measurements 1981 (PDF)]] | ||
* [[Media:42W-6694.pdf|High Frequency Wafer Probing (PDF, OCR)]] | * [[Media:42W-6694.pdf|High Frequency Wafer Probing (PDF, OCR)]] | ||
* [[Media:85W-8885-0.pdf|TDR Tools in Modeling Interconnects and Packages (PDF, OCR)]] | |||
* [[Media:Tek z-profile algorithm.pdf|Z-Profile Algorithm (PDF, OCR)]] | * [[Media:Tek z-profile algorithm.pdf|Z-Profile Algorithm (PDF, OCR)]] | ||
[[Category:Documentation]] | [[Category:Documentation]] | ||