Patent US 4527272A: Difference between revisions
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|Grant date=1985-07-02 | |Grant date=1985-07-02 | ||
|Cites=Patent US 4058851A;Patent US 4099668A;Patent US 4194113A;Patent US 4312067A;Patent US 4385385A;Patent JP S5226700B2;Patent US 3976864A | |Cites=Patent US 4058851A;Patent US 4099668A;Patent US 4194113A;Patent US 4312067A;Patent US 4385385A;Patent JP S5226700B2;Patent US 3976864A | ||
|Links=Signature analysis | |||
}} | }} | ||
Latest revision as of 05:04, 14 October 2024
| Patent number | US 4527272A (click link for details and documents via Google Patents) |
|---|---|
| Title | Signature analysis using random probing and signature memory |
| Inventors | Michael G. Reiney |
| Company | Tektronix Inc |
| Filing date | 1982-12-06 |
| Grant date | 1985-07-02 |
Cites:
| Patent | Title | Inventors | Assignee | Granted |
|---|---|---|---|---|
| Patent US 3976864A | Apparatus and method for testing digital circuits | Gary B. Gordon • George A. Haag • Jan R. Hofland • Daniel I. Kolody | Hewlett-Packard | 1976-08-24 |