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Patent US 8384411B2

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Patent number US 8384411B2 (click link for details and documents via Google Patents)
Title Method and device for measuring inter-chip signals
Inventors Bart A. MOOYMAN-BECK, Bob Woolhiser, Kevin E. Cosgrove, Dan Knierim
Company Tektronix Inc
Filing date 2009-12-18
Grant date 2013-02-26



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