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Patent US 8384411B2: Difference between revisions
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|Title=Method and device for measuring inter-chip signals | |Title=Method and device for measuring inter-chip signals | ||
|Company=Tektronix Inc | |Company=Tektronix Inc | ||
|Inventors=Bart A. MOOYMAN-BECK; | |Inventors=Bart A. MOOYMAN-BECK; Bob Woolhiser; Kevin E. Cosgrove; Dan Knierim | ||
|Filing date=2009-12-18 | |Filing date=2009-12-18 | ||
|Grant date=2013-02-26 | |Grant date=2013-02-26 | ||
}} | }} | ||