File:42W-6694.pdf: Difference between revisions

Latest revision as of 04:07, 9 October 2023

**Application Note**
ID	42W-6694
Title	High Frequency Wafer Probing
Authors
Year	1987
Links

Oct 1987 (scan w/ OCR text)

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	Date/Time	Thumbnail	Dimensions	User	Comment
current	20:39, 15 September 2020		1,239 × 1,635, 12 pages (12.87 MB)	Dgajanov (talk \| contribs)	Tektronix 7854 Application Note: High Frequency Wafer Probing 42W-6694 Oct 1987 (scan w/ OCR text)

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Short title	Application Note: High Frequency Wafer Probing
Author	Tektronix, Inc.
Keywords	wafer, probe, 7854, reflectometry, TDR, Cascade Microtech, 42W-6694
Conversion program	GPL Ghostscript 9.16
Encrypted	no
Page size	595.44 x 785.28 pts
Version of PDF format	1.5

@@ Line 1: / Line 1: @@
-Tektronix 7854 Application Note: High Frequency Wafer Probing
+{{AppNote
-W-6694 Oct 1987
+|Identifier=42W-6694
+|File=42W-6694.pdf
+|Title=High Frequency Wafer Probing
+|Authors=
+|Year=1987
+|Links=
+}}
+Oct 1987
 (scan w/ OCR text)