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S-3100: Difference between revisions
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The '''Tektronix S-3100''' is a family of automated test systems, introduced at WESCON in July 1967. | The '''Tektronix S-3100''' is a family of automated test systems, introduced at WESCON in July 1967. | ||
They use a package consisting of a [[568|568 programmable readout oscilloscope]], dual channel vertical sampling plug-ins ([[3S5]]/[[3S6]]), and delaying sweep time bases ([[3T5]]/[[3T6]]), plus a digital readout unit ([[230]]). | They use a package consisting of a [[568|568 programmable readout oscilloscope]], | ||
dual channel vertical sampling plug-ins ([[3S5]]/[[3S6]]), | |||
and delaying sweep time bases ([[3T5]]/[[3T6]]), plus a digital readout unit ([[230]]). | |||
==Link== | ==Link== | ||
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* [[Media:070-3065-00.pdf|Automated Measurement Systems: System Calibration Introduction (PDF)]] | * [[Media:070-3065-00.pdf|Automated Measurement Systems: System Calibration Introduction (PDF)]] | ||
* [[Media:Tek s-3101 from 1964-1965 american microelectronics data annual.pdf|Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual (PDF)]] | * [[Media:Tek s-3101 from 1964-1965 american microelectronics data annual.pdf|Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual (PDF)]] | ||
==See Also== | |||
* [[015-0139-00]] input-output panel | |||
==Pictures== | ==Pictures== | ||