SD-20: Difference between revisions
Jump to navigation
Jump to search
No edit summary |
No edit summary |
||
| Line 10: | Line 10: | ||
|designers= | |designers= | ||
|manuals= | |manuals= | ||
* [[Media:070-7531-02.pdf|Tektronix SD-20 User Manual]] | * [[Media:070-7531-02.pdf|Tektronix SD-20 User Manual]] | ||
* [ | * [https://w140.com/72nd_ARFTG_Conference_CD.pdf 2008 Harper, Ridler, and Salter Paper Discussing TDR with SD-20] | ||
}} | }} | ||
The '''Tektronix SD-20 Loopthrough Sampling Head''' is a single-channel, 20 GHz loop-through sampling head designed for low-loss testing in applications such as microwave systems research and development, digital device characterization and high-speed digital communications circuit design. | The '''Tektronix SD-20 Loopthrough Sampling Head''' is a single-channel, 20 GHz loop-through sampling head designed for low-loss testing in applications such as microwave systems research and development, digital device characterization and high-speed digital communications circuit design. | ||