36,733
edits
SD-22: Difference between revisions
no edit summary
No edit summary |
No edit summary |
||
| Line 1: | Line 1: | ||
{{Plugin Sidebar | {{Plugin Sidebar | ||
|manufacturer=Tektronix | |||
summary = 12.5 GHz dual channel Sampling Head | |series=11800-series scopes | ||
|type=SD-22 | |||
image=SD22-1E.jpg | | |summary=12.5 GHz dual channel Sampling Head | ||
caption=Tektronix SD-22 Sampling Head | | |image=SD22-1E.jpg | ||
introduced = 1989 | | |caption=Tektronix SD-22 Sampling Head | ||
discontinued = (?) | | |introduced=1989 | ||
|discontinued=(?) | |||
|designers= | |||
manuals= | manuals= | ||
* [http://w140.com/tek_sd-22_sd-26.pdf Tektronix SD-22 and SD-26 Service Manual (PDF)] | * [http://w140.com/tek_sd-22_sd-26.pdf Tektronix SD-22 and SD-26 Service Manual (PDF)] | ||
| Line 15: | Line 17: | ||
From the Tektronix site: | From the Tektronix site: | ||
<blockquote> | <blockquote> | ||
The SD22 is a dual-channel, 12.5 GHz sampling head specifically designed for low-noise | The SD22 is a dual-channel, 12.5 GHz sampling head specifically designed for low-noise measurement in digital communications and device characterization applications. | ||
measurement in digital communications and device characterization applications. It provides an | It provides an acquisition rise time of 28 ps, and typically 450 µV<sub>RMS</sub> of displayed noise. | ||
acquisition rise time of 28 ps, and typically 450 µV<sub>RMS</sub> of displayed | With smoothing, noise levels are 180 µV<sub>RMS</sub>. | ||
noise. With smoothing, noise levels are 180 µV<sub>RMS</sub>. | |||
</blockquote> | </blockquote> | ||
<blockquote> | <blockquote> | ||
In order to precisely capture and display the switching characteristics of high-speed communications | In order to precisely capture and display the switching characteristics of high-speed communications circuits, to make accurate statistical measurements of signal noise and signal timing jitter, or to obtain stable timing measurements of fast digital ICs, the noise floor of the test equipment must be kept to a minimum. The SD22 is the ideal instrument for these low-noise applications. | ||
circuits, to make accurate statistical measurements of signal noise and signal timing jitter, or to obtain | |||
stable timing measurements of fast digital ICs, the noise floor of the test equipment must be kept to a | |||
minimum. The SD22 is the ideal instrument for these low-noise applications. | |||
</blockquote> | </blockquote> | ||
| Line 49: | Line 47: | ||
[[Category:11800 series sampling plugins]] | [[Category:11800 series sampling plugins]] | ||