Patent US 4755742A

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Patent number US 4755742A (click link for details and documents via Google Patents)
Title Dual channel time domain reflectometer
Inventors Agoston Agoston, John Rettig, Stan Kaveckis, John E. Carlson, Andrew E. Finkbeiner
Company Tektronix Inc
Filing date 1986-04-30
Grant date 1988-07-05

Cites:

Patent Title Inventors Assignee Granted
Patent US 3434049A Time domain reflectometry system having a current source for locating discontinuities in a transmission line George Frye Tektronix Inc 1969-03-18
Patent US 3771056A Display baseline stabilization circuit Henry A Zimmerman Tektronix Inc 1973-11-06
Patent US 4647795A Travelling wave sampler Agoston Agoston Tektronix Inc 1987-03-03
Patent US 4654600A Phase detector Larry Lockwood Tektronix Inc 1987-03-31
Patent US 4659945A Sampling bridge Art Metz Tektronix Inc 1987-04-21
Patent US 4659946A Memory gate for error sampler Agoston Agoston Tektronix Inc 1987-04-21

Related products:

Manufacturer Model Description Introduced Designers
Tektronix SD-24 20 GHz sampling/TDR head 1989 Agoston Agoston John Rettig