Drilldown: Patents

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Patents > Company : Fluke Corp or Maxim or Tektronix Inc

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Inventors:
Dan Knierim (35) · Bozidar Janko (32) · Bruce J. Penney (31) · Phil Crosby (29) · Art Metz (28) · Linley Gumm (22) · Conrad Odenthal (21) · Thomas S. Buzak (21) · Agoston Agoston (19) · Hiro Moriyasu (17) · Val Garuts (16) · John Addis (15) · Cornelis Teunis Veenendaal (13) · George Frye (13) · John Kobbe (13) · Les Larson (13) · Gene Andrews (12) · Lloyd Rodney Bristol (12) · William E. Berg (12)
 
Company: (Click arrow to add another value)
Filing date:
None (5) · 1950 - 1959 (19) · 1960 - 1969 (196) · 1970 - 1979 (299) · 1980 - 1989 (859) · 1990 - 1999 (89) · 2000 - 2009 (32) · 2010 - 2019 (14)
Grant date:
None (9) · 1950 - 1959 (10) · 1960 - 1969 (135) · 1970 - 1979 (297) · 1980 - 1989 (777) · 1990 - 1999 (232) · 2000 - 2009 (39) · 2010 - 2019 (14)
Cites:
None (1457) · Patent US 3293474A (9) · Patent US 3531675A (7) · Patent US 3293473A (6) · Patent US 3594607A (5) · Patent US 3710173A (5) · Patent US 3982150A (4) · Patent US 3312850A (3) · Patent US 3689752A (3) · Patent US 3725792A (3) · Patent US 3956662A (3) · Patent US 3978366A (3) · Patent US 4121164A (3) · Patent US 4146844A (3)
Links:
None (1365) · Direct-view storage CRT (51) · TDS3012 (10) · TDS3012B (10) · TDS3014 (10) · TDS3032 (10) · TDS3034 (10) · TDS3052 (10) · TDS3054 (10) · TDS3054B (10) · TDS3054C (10) · Sampling (7) · 465 (5) · 475 (5) · 7A19 (5) · 7A24 (5) · 7T11 (5) · Time domain reflectometers (5)
 

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