Application Notes
- AX-3079: Television Products App Note no. 17, The Auxiliary Video Facility of the 1480-Series of Waveform Monitors, 1974 (PDF) (→ 1480)
- AX-3106: Television Application Note no. 19, Vertical Interval Test Signals - Reprogramming Tektronix Signal Generators, 1975 (PDF) (→ 147 149 1440)
- AX-3107: Clifford B. Schrock, The Tektronix Cookbook of Standard Audio Tests using the 5L4N Low Frequency Spectrum Analyzer, 1979 (PDF) (→ 5L4N)
- AX-3197-1: Testing Optoisolators, 1978 (PDF)
- AX-3264: Television Products App Note no. 20, A New NTSC Graticule for the 1480 Waveform Monitor, 1975 (PDF) (→ 1480)
- AX-3265-1: Television Products App Note no. 22, Shortening the Blanking Intervals of the Tektronix 140-144-146 NTSC Generators, 1976 (PDF) (→ 140 144 146)
- AX-3388: Stu Rasmussen, Television Products App Note no. 23, Multiburst Testing with the 1470, 1976 (PDF) (→ 1470)
- AX-3406-1: Morris Engelson, EMI Applications Using the Spectrum Analyzer, 1979 (PDF) (→ 7L5)
- AX-3524: Logic Analyzer App Note #57K1.0, Troubleshooting a Microprocessor, 1977 (PDF) (→ 7D01 DF1)
- AX-3535: Morris Engelson, Crystal Device Measurements Using the Spectrum Analyzer, 1977 (PDF) (→ 7L5)
- AX-3607: S. C. Baunach, An Example of an M6800-Based GPIB Interface, 1977 (PDF)
- AX-4281: Measurement Variety. An Engineering Challenge Featuring the 7854., 1981 (PDF) (→ 7854)
- 26AX-3582-3: Clifford B. Schrock, FM Broadcast Measurements Using the Spectrum Analyzer, 1981 (PDF) (→ 7L12 7K11 5L4N SG502)
- 03W-8605-3: XYZs of Oscilloscopes – Primer, 2009 (PDF)
- 20W-7076: Using the Multipulse Waveform to Measure Group Delay and Amplitude Errors, 1991 (PDF) (→ 1910)
- 26W-4889: No Loose Ends - Revised - The Tektronix Proof-of-Performance Program for CATV, 1982 (PDF) (→ 7L12 7L14 147 1430)
- 26W-5360: Bill Benedict, Fundamentals of Spectrum Analysis, 1983 (PDF)
- 26W-5390: Bob Alm and Len Garrett, Spectrum Analysis utilizing Waveguide Mixers, 1983 (PDF) (→ WM490 )
- 26W-5653: 7854 with spectrum analyzer plugins (please add)
- 26W-7045: Morris Engelson, Random Noise Measurement with the Spectrum Analyzer, 1989 (PDF) (→ 2710 2754P)
- 37W-7655: Scope Evaluation Guide & Circuit Board Instructions, 1989 (PDF)
- 37W-60373-0: USB Spectrum Analyzers and SignalVu-PC – Frequently Asked Questions, 2016 (PDF)
- 42AX-4682: Introduction to 7854 Oscilloscope Measurement and Programming Techniques, 1981 (PDF, OCR) (→ 7854)
- 42W-5334: Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In, 1983 (PDF, OCR) (→ 7854 7S12)
- 42W-5700: Power Supply/Device Testing, 1984 (PDF, OCR) (→ 7854)
- 42W-6694: High Frequency Wafer Probing, 1987 (PDF, OCR) (→ 7854)
- 51W-10798-1: Power-Electronics Measurements Made Easy with TDS Oscilloscopes, 1996 (PDF)
- 60AX-4741: Floating Oscilloscope Measurements ... And Operator Protection, 1981 (PDF) (→ A6901 A6902 221)
- 60W-6053: Les Hurlock, The ABCs of Probes, 1986 (PDF)
- 60W-6053-8: ABCs of Probes – Primer, 2003 (PDF, OCR)
- 85W-8885-0: TDR Tools in Modeling Interconnects and Packages, 1993 (PDF, OCR)
- 85W-8882-0: Z-Profile Algorithm, 1993 (PDF, OCR)
- 2EW-8380-1: Spectrum Analyzer Fundamentals, 1993 (PDF)
- 2EW-10598-0: Cable TV Measurements Using the 2714/2715 Spectrum Analyzers, 1995 (PDF) (→ 2714 2715)
"Digital Application Notes"
- 7000 Series Digital Plug-In Applications, 1977 (PDF, OCR)
- 42W-5017: Increased Measurement Accuracy Using a 7D15 Universal Counter/Timer in Any 7000 Series Oscilloscope, 1982 (PDF) (→ 7D15)
- (please add) Measuring time Interval Between Νοn-Adjacent Digital Word Train Pulses or Multi-Echo Radar Pulses (→ 7D15)
- (please add) Counting Events in a Burst and Measuring Burst Frequency (→ 7D14)
- (please add) Digital Delay in an Oscilloscope Makes Your Radar Pulse Time Delay Measurements Quicker, Easier and More Accurate (→ 7D11)
- (please add) Measuring Memory Core I/Ο Signals with Digital Accuracy (→ 7D12//M2, 7D15)
- (please add) Measuring Disc Drive Access Time and Access Voltages with Tektronix 7000-Series Digital Plug-ins (→ 7D12//M2, 7D15)
- (please add) SCR Gating Waveform Measurements with High Resolution Digital Accuracy (→ 7D12//M2)
- (please add) Why Use Digital Events in Your Measurement Applications (→ 7D11)