| App Note |
Title |
Author |
Year |
Instruments Referenced
|
| AX-3079 |
The Auxiliary Video Facility of the 1480-Series of Waveform Monitors (TV Products App Note No.17) |
|
1974 |
1480
|
| AX-3106 |
Vertical Interval Test Signals - Reprogramming Tektronix Signal Generators (TV Products App Note No.19) |
|
1975 |
147, 149, 1440
|
| AX-3107 |
The Tektronix Cookbook of Standard Audio Tests using the 5L4N Low Frequency Spectrum Analyzer |
Clifford B. Schrock |
1979 |
5L4N
|
| AX-3197 |
Testing Optoisolators |
|
1978 |
|
| AX-3264 |
A New NTSC Graticule for the 1480 Waveform Monitor (TV Products App Note No.20) |
|
1975 |
1480
|
| AX-3265 |
Shortening the Blanking Intervals of the Tektronix 140-144-146 NTSC Generators (TV Products App Note No.22) |
|
1976 |
140, 144, 146
|
| AX-3388 |
Multiburst Testing with the 1470 (TV Products App Note No.23) |
Stu Rasmussen |
1976 |
1470
|
| AX-3406 |
EMI Applications Using the Spectrum Analyzer |
Morris Engelson |
1979 |
7L5
|
| AX-3524 |
Troubleshooting a Microprocessor (Logic Analyzer App Note #57K1.0) |
|
1977 |
7D01, DF1
|
| AX-3535 |
Crystal Device Measurements Using the Spectrum Analyzer |
Morris Engelson |
1977 |
7L5
|
| AX-3607 |
An Example of an M6800-Based GPIB Interface |
S. C. Baunach |
1977 |
|
| AX-3957 |
X-Y Displays with Interval Timing for Measuring SOA |
|
1979 |
7D15, 7A17
|
| AX-4281 |
Measurement Variety. An Engineering Challenge Featuring the 7854. |
|
1981 |
7854
|
| AX-3582 |
FM Broadcast Measurements Using the Spectrum Analyzer |
Clifford B. Schrock |
1981 |
7L12, 7K11, 5L4N, SG502
|
| 20W-7076 |
Using the Multipulse Waveform to Measure Group Delay and Amplitude Errors |
|
1991 |
1910
|
| 26W-4889 |
No Loose Ends - Revised - The Tektronix Proof-of-Performance Program for CATV |
|
1982 |
7L12, 7L14, 147, 1430
|
| 26W-5360 |
Fundamentals of Spectrum Analysis |
Bill Benedict |
1983 |
|
| 26W-5390 |
Spectrum Analysis utilizing Waveguide Mixers |
Bob Alm, Len Garrett |
1983 |
WM490
|
| 26W-5653 |
7854 With Spectrum Analyzer Plugins (please add) |
|
|
7854
|
| 26W-7045 |
Random Noise Measurement with the Spectrum Analyzer |
Morris Engelson |
1989 |
2710, 2754P
|
| 37W-7655 |
Scope Evaluation Guide & Circuit Board Instructions |
|
1989 |
|
| 42AX-4682 |
Introduction to 7854 Oscilloscope Measurement and Programming Techniques |
|
1981 |
7854
|
| 42W-5017 |
Increased Measurement Accuracy Using a 7D15 Universal Counter/Timer in any 7000 Series Oscilloscope |
|
1982 |
7D15
|
| 42W-5334 |
Automated TDR Testing Made Easy with the 7854 Oscilloscope/7S12 Sampler Plug-In |
|
1983 |
7854, 7S12
|
| 42W-5700 |
Power Supply/Device Testing |
|
1984 |
7854
|
- 42W-6694: High Frequency Wafer Probing, 1987 (→ 7854)
- 51W-10798-1: Power-Electronics Measurements Made Easy with TDS Oscilloscopes, 1996
- 60AX-4741: Floating Oscilloscope Measurements ... And Operator Protection, 1981 (→ A6901 A6902 221)
- 60W-6053: Les Hurlock, The ABCs of Probes, 1986
- 60W-6053-8: ABCs of Probes – Primer, 2003
- 85W-8885-0: TDR Tools in Modeling Interconnects and Packages, 1993
- 85W-8882-0: Z-Profile Algorithm, 1993
- 2EW-8380-1: Spectrum Analyzer Fundamentals, 1993
- 2EW-10598-0: Cable TV Measurements Using the 2714/2715 Spectrum Analyzers, 1995 (→ 2714, 2715)
- media:03W-8605-3.pdf 03W-8605-3, XYZs of Oscilloscopes (Primer) 2009
| 37W-60373 || : USB Spectrum Analyzers and SignalVu-PC – Frequently Asked Questions, 2016
"Digital Application Notes"
- 7000 Series Digital Plug-In Applications, 1977
- (please add) Measuring time Interval Between Νοn-Adjacent Digital Word Train Pulses or Multi-Echo Radar Pulses (→ 7D15)
- (please add) Counting Events in a Burst and Measuring Burst Frequency (→ 7D14)
- (please add) Digital Delay in an Oscilloscope Makes Your Radar Pulse Time Delay Measurements Quicker, Easier and More Accurate (→ 7D11)
- (please add) Measuring Memory Core I/Ο Signals with Digital Accuracy (→ 7D12//M2, 7D15)
- (please add) Measuring Disc Drive Access Time and Access Voltages with Tektronix 7000-Series Digital Plug-ins (→ 7D12//M2, 7D15)
- (please add) SCR Gating Waveform Measurements with High Resolution Digital Accuracy (→ 7D12//M2)
- (please add) Why Use Digital Events in Your Measurement Applications (→ 7D11)