Patent US 6246717B1: Revision history

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20 March 2024

  • curprev 06:5506:55, 20 March 2024‎ Peter talk contribs‎ 259 bytes +259‎ Created page with "{{Patent |Office=US |Number=6246717B1 |Title=Measurement test set and method for in-service measurements of phase noise |Company=Tektronix Inc |Inventors=Xiaofen Chen;Linley Gumm;Dana E. Whitlow;Larry Lockwood |Filing date=1998-11-03 |Grant date=2001-06-12 }}"
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