Page values for "Patent US 6246717B1"
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"_pageData" values
1 row is stored for this page| Field | Field type | Value |
|---|---|---|
| _creationDate | Datetime | 2024-03-20 1:55:44 PM |
| _modificationDate | Datetime | 2024-03-20 1:55:44 PM |
| _categories | List of String, delimiter: | | Patents |
| _isRedirect | Boolean | No |
| _pageID | Integer | 35,198 |
| _pageName | Page | Patent US 6246717B1 |
| _pageTitle | String | Patent US 6246717B1 |
| _pageNamespace | Integer | 0 |
"Patents" values
1 row is stored for this page| Field | Field type | Value |
|---|---|---|
| Office | String | US |
| Number | String | 6246717B1 |
| Title | String | Measurement test set and method for in-service measurements of phase noise |
| Inventors | List of Page, delimiter: ; | Xiaofen Chen • Linley Gumm • Dana E. Whitlow • Larry Lockwood |
| Company | List of Page, delimiter: ; | Tektronix Inc |
| Filing_date | Date | 1998-11-03 |
| Grant_date | Date | 2001-06-12 |
| Cites | List of Page, delimiter: ; | |
| Links | List of Page, delimiter: ; |