Patent US 8436624B2: Difference between revisions
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{{Patent | {{Patent | ||
|Office=US | |Office=US | ||
|Number= | |Number=8436624B2 | ||
|Title=Signal acquisition system having reduced probe loading of a device under test | |Title=Signal acquisition system having reduced probe loading of a device under test | ||
|Company=Tektronix Inc | |Company=Tektronix Inc | ||
|Inventors=Josiah A. | |Inventors=Josiah A. Bartlett; Ira G. Pollock; Dan Knierim; Les Larson; Scott R. Jansen; Kenneth P. Dobyns; Michael Duane Stevens | ||
|Filing date=2010-07-29 | |Filing date=2010-07-29 | ||
|Grant date=2013-05-07 | |Grant date=2013-05-07 | ||
}} | }} | ||
Latest revision as of 05:17, 13 December 2022
| Patent number | US 8436624B2 (click link for details and documents via Google Patents) |
|---|---|
| Title | Signal acquisition system having reduced probe loading of a device under test |
| Inventors | Josiah A. Bartlett, Ira G. Pollock, Dan Knierim, Les Larson, Scott R. Jansen, Kenneth P. Dobyns, Michael Duane Stevens |
| Company | Tektronix Inc |
| Filing date | 2010-07-29 |
| Grant date | 2013-05-07 |