S-3100: Difference between revisions
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{{Instrument Sidebar | |||
* [[Media: | |manufacturer=Tektronix | ||
|model=S-3100 | |||
|class=Signal processing system | |||
|series= | |||
|summary=Signal processing system | |||
|image=Tek s-3100.jpg | |||
|caption=Tektronix S-3100 Signal Processing System (Photo from 1968 Catalog) | |||
|introduced=1967 | |||
|discontinued=(?) | |||
|designers= | |||
|manuals= | |||
* [[Media:070-3017-00.pdf|Tektronix Type S-3110 Operating Instructions]] | |||
* ''please add'' [[Category:Manual needed]] | |||
}} | |||
The '''Tektronix S-3100''' is a family of automated test systems, introduced at WESCON in July 1967. | |||
They use a package consisting of a [[568|568 programmable readout oscilloscope]], | |||
dual channel vertical sampling plug-ins ([[3S5]]/[[3S6]]), | |||
and delaying sweep time bases ([[3T5]]/[[3T6]]), plus a digital readout unit ([[230]]). | |||
==Links== | |||
* [[Media:S-3100 Series Brochure.pdf | S-3100 Series Brochure]] | |||
* [https://w140.com/tek_s-3100_1968_catalog.pdf Tektronix S-3100 in 1968 Catalog] | |||
* [https://w140.com/tek_s-3110_1968_cat.pdf Tektronix S-3110 in 1968 Catalog] | |||
* [[Media:070-3065-00.pdf | Automated Measurement Systems: System Calibration Introduction]] | |||
* [[Media:Tek s-3101 from 1964-1965 american microelectronics data annual.pdf | Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual]] | |||
{{Documents|Link=S-3100}} | |||
{{Documents|Link=S-3110}} | |||
{{Documents|Link=S-3150}} | |||
==See Also== | |||
* [[015-0139-00]] input-output panel | |||
==Pictures== | |||
<gallery> | <gallery> | ||
Tek s-3100.jpg | Photo from 1968 Catalog | |||
S3100_block.png | Block Diagram | |||
</gallery> | </gallery> | ||
[[Category: | [[Category:Automated test systems]] | ||
Latest revision as of 18:43, 7 November 2024
The Tektronix S-3100 is a family of automated test systems, introduced at WESCON in July 1967.
They use a package consisting of a 568 programmable readout oscilloscope, dual channel vertical sampling plug-ins (3S5/3S6), and delaying sweep time bases (3T5/3T6), plus a digital readout unit (230).
Links
- S-3100 Series Brochure
- Tektronix S-3100 in 1968 Catalog
- Tektronix S-3110 in 1968 Catalog
- Automated Measurement Systems: System Calibration Introduction
- Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual
Documents Referencing S-3100
- (no results)
Documents Referencing S-3110
| Document | Class | Title | Authors | Year | Links |
|---|---|---|---|---|---|
| Tekscope 1970 V2 N4 Aug 1970.pdf | Article | Automated Measurement Systems | 1970 | S-3150 • 568 • 230 • S-3110 • 241 • 240 | |
| Tekscope 1970 V2 N4 Aug 1970.pdf | Article | Some Thoughts from a System Builder | Morgan Howells | 1970 | S-3110 • S-3111 • S-3120 • S-3130 • S-3150 |
Documents Referencing S-3150
| Document | Class | Title | Authors | Year | Links |
|---|---|---|---|---|---|
| Tekscope 1970 V2 N4 Aug 1970.pdf | Article | Automated Measurement Systems | 1970 | S-3150 • 568 • 230 • S-3110 • 241 • 240 | |
| Tekscope 1970 V2 N4 Aug 1970.pdf | Article | Some Experiences in IC Testing | Oris Nussbaum | 1970 | S-3130 • S-3150 |
| Tekscope 1970 V2 N4 Aug 1970.pdf | Article | Some Thoughts from a System Builder | Morgan Howells | 1970 | S-3110 • S-3111 • S-3120 • S-3130 • S-3150 |
See Also
- 015-0139-00 input-output panel
Pictures
-
Photo from 1968 Catalog
-
Block Diagram
