S-3100: Difference between revisions

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|summary=Signal processing system
|summary=Signal processing system
|image=Tek s-3100.jpg
|image=Tek s-3100.jpg
|caption=Tektronix S-3100 Signal processing system (Photo from 1968 Catalog)
|caption=Tektronix S-3100 Signal Processing System (Photo from 1968 Catalog)
|introduced=1967
|introduced=1967
|discontinued=(?)
|discontinued=(?)
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==Link==
==Link==
* [[Media:S-3100 Series Brochure.pdf|S-3100 Series Brochure (PDF)]]  
* [[Media:S-3100 Series Brochure.pdf | S-3100 Series Brochure (PDF)]]  
* [https://w140.com/tek_s-3100_1968_catalog.pdf Tektronix S-3100 in 1968 Catalog (PDF)]
* [https://w140.com/tek_s-3100_1968_catalog.pdf Tektronix S-3100 in 1968 Catalog (PDF)]
* [https://w140.com/tek_s-3110_1968_cat.pdf Tektronix S-3110 in 1968 Catalog (PDF)]
* [https://w140.com/tek_s-3110_1968_cat.pdf Tektronix S-3110 in 1968 Catalog (PDF)]
* [[Media:070-3065-00.pdf|Automated Measurement Systems: System Calibration Introduction (PDF)]]
* [[Media:070-3065-00.pdf | Automated Measurement Systems: System Calibration Introduction (PDF)]]
* [[Media:Tek s-3101 from 1964-1965 american microelectronics data annual.pdf|Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual (PDF)]]
* [[Media:Tek s-3101 from 1964-1965 american microelectronics data annual.pdf | Tektronix S-3101 Description in 1964-1965 American Microelectronics Data Annual (PDF)]]


==See Also==
==See Also==
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==Pictures==
==Pictures==
<gallery>
<gallery>
Tek s-3100.jpg|Photo from 1968 Catalog
Tek s-3100.jpg | Photo from 1968 Catalog
S3100_block.png|Block Diagram
S3100_block.png | Block Diagram
</gallery>
</gallery>




[[Category:Automated test systems]]
[[Category:Automated test systems]]

Revision as of 21:48, 29 September 2023

Tektronix S-3100
Signal processing system
Tektronix S-3100 Signal Processing System (Photo from 1968 Catalog)

Produced from 1967 to (?)

Manuals
  • please add
(All manuals in PDF format unless noted otherwise)
Manuals – Specifications – Links – Pictures

The Tektronix S-3100 is a family of automated test systems, introduced at WESCON in July 1967.

They use a package consisting of a 568 programmable readout oscilloscope, dual channel vertical sampling plug-ins (3S5/3S6), and delaying sweep time bases (3T5/3T6), plus a digital readout unit (230).

Link

See Also

Pictures