Ira Pollock

Ira G. Pollock (? – ?)

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Documents Authored by Ira Pollock

Document Page Class Title Author(s) Year Refers to
Tekscope 1976 V8 N2.pdf 12 Article The FG504 - A New Standard in Function Generators Ira Pollock 1976 FG504

Patents by Ira G. Pollock

Page Office Number Title Inventors Company Filing date Grant date
Patent US 4641048A US 4641048A Digital integrated circuit propagation delay time controller Ira G. Pollock Tektronix Inc 1984-08-24 1987-02-03
Patent US 4739194A US 4739194A Supergate for high speed transmission of signals Dennis E. Glasby Ira G. Pollock Gale F. Hall Tektronix Inc 1986-11-25 1988-04-19
Patent US 4740746A US 4740746A Controlled impedance microcircuit probe Ira G. Pollock Jon C. Manor Tektronix Inc 1987-02-24 1988-04-26
Patent US 4860291A US 4860291A Test vector definition system employing template concept Wendell W. Damm Keith Taylor Ira G. Pollock Pedro Max Janowitz Tektronix Inc 1987-12-28 1989-08-22
Patent US 4839841A US 4839841A Programmable digital multiple event generator Michael S. Hagen Keith Taylor Ira G. Pollock Tektronix Inc 1988-02-01 1989-06-13
Patent US 2011074441 US 2011074441 Low Capacitance Signal Acquisition System Josiah A. Bartlett Ira G. Pollock Dan Knierim Les Larson Scott R. Jansen Kenneth P. Dobyns Michael Duane Stevens Tektronix Inc 2009-09-30
Patent US 2011074389 US 2011074389 Signal Acquisition System Having Probe Cable Termination in a Signal Processing Instrument Dan Knierim Josiah A. Bartlett Ira G. Pollock Les Larson Tektronix Inc 2010-07-29
Patent US 2011074391 US 2011074391 Signal Acquisition System Having a Compensation Digital Filter Josiah A. Bartlett Ira G. Pollock Dan Knierim Les Larson Scott R. Jansen Kenneth P. Dobyns Michael Duane Stevens Tektronix Inc 2010-07-29
Patent US 2011074392 US 2011074392 Signal Acquisition System Having Reduced Probe Loading of a Device Under Test Josiah A. Bartlett Ira G. Pollock Dan Knierim Les Larson Scott R. Jansen Kenneth P. Dobyns Michael Duane Stevens Tektronix Inc 2010-07-29
Patent US 8436624B2 US 8436624B2 Signal acquisition system having reduced probe loading of a device under test Josiah A. Bartlett Ira G. Pollock Dan Knierim Les Larson Scott R. Jansen Kenneth P. Dobyns Michael Duane Stevens Tektronix Inc 2010-07-29 2013-05-07
Patent US 2014103951 US 2014103951 Automatic probe ground connection checking techniques Dan Knierim William A. Hagerup Barton T. Hickman Ira G. Pollock Tektronix Inc 2012-10-11